Abstract: A system includes a memory component and a processing device operatively coupled with the memory component. The processing device performs a test of the memory component by generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed, generating ECC values for subsequent operations of the test, and reporting the ECC value generated for the last of the subsequent operations of the test in an event log. The ECC value for each respective subsequent operation of the test is generated based on an address in the memory component on which that respective subsequent operation of the test is performed, and the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation.

Abstract: A system includes a memory component and a processing device operatively coupled with the memory component. The processing device performs a test of the memory component by generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed, generating ECC values for subsequent operations of the test, and reporting the ECC value generated for the last of the subsequent operations of the test in an event log. The ECC value for each respective subsequent operation of the test is generated based on an address in the memory component on which that respective subsequent operation of the test is performed, and the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation.

Abstract: A system includes a memory component and a processing device operatively coupled with the memory component. The processing device performs a test of the memory component by generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed, generating ECC values for subsequent operations of the test, and reporting the ECC value generated for the last of the subsequent operations of the test in an event log. The ECC value for each respective subsequent operation of the test is generated based on an address in the memory component on which that respective subsequent operation of the test is performed, and the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation.

Abstract: A memory component has a block of memory cells that has been designated as a bad block. A processing device included in the memory component identifies a functional page of memory cells in the bad block, and programs system data to the identified functional page of memory cells in the bad block.