Abstract: A system and method for providing an on-demand user interface for an input device. The system includes a first device and a second device. The first device is configured to receive a first user input and select a first notification from a plurality of notifications stored on the first device based at least in part on the first user input. The first device then outputs the first notification using one or more hardware resources. The second device detects the first notification output by the first device and matches the first notification to a first content item stored on the second device. The first content item includes instructions for providing a second user input on the first device. The second device then renders the first content item on a display. The first device further receives the second user input subsequent to the first user input.

Abstract: Systems and methods for performing a device operation in response to a touch input and based on a user's gaze are described. An example device includes a touch sensor configured to sense a touch input from a user, a gaze sensor configured to capture gaze information regarding a user's gaze, one or more processors, and a memory coupled to the one or more processors. The memory stores instructions that, when executed by the one or more processors, cause the device to determine a feature of the user's gaze based on the captured gaze information, and disregard the touch input based on the feature of the user's gaze.

Abstract: A touch panel including a first substrate and a sensing electrode is provided. The sensing electrode includes a first metal layer, a metal second metal layer, a metal nitride layer, and a metal oxide layer. The first metal layer is disposed on the first substrate and includes a first metallic element. The second metal layer includes a second metallic element. The metal nitride layer includes the second metallic element and is disposed on the second metal layer. The metal oxide layer is disposed on the metal nitride layer.

Abstract: A method of inspecting the grain size of a polysilicon film. A substrate covered by an amorphous silicon layer is provided. Next, the amorphous silicon layer is annealed by a laser beam with a predetermined laser energy density to transfer it to a polysilicon layer. Thereafter, the polysilicon layer is measured by a spectrometer under a predetermined photon energy range to achieve an optical parameter. Finally, the optical parameter is quantized to achieve a determining index, thereby monitoring the grain size of the polysilicon layer.

Abstract: A method of inspecting the grain size of a polysilicon film. A substrate covered by an amorphous silicon layer is provided. Next, the amorphous silicon layer is annealed by a laser beam with a predetermined laser energy density to transfer it to a polysilicon layer. Thereafter, the polysilicon layer is measured by a spectrometer under a predetermined photon energy range to achieve an optical parameter. Finally, the optical parameter is quantized to achieve a determining index, thereby monitoring the grain size of the polysilicon layer.