Abstract: A semiconductor structure including a first die, a second die stacked on the first die, a smoothing layer disposed on the first die and a filling material layer disposed on the smoothing layer. The second die has a dielectric portion and a semiconductor material portion disposed on the dielectric portion. The smoothing layer includes a first dielectric layer and a second dielectric layer, and the second dielectric layer is disposed on the first dielectric layer. The dielectric portion is surrounded by the smoothing layer, and the semiconductor material portion is surrounded by the filling material layer. A material of the first dielectric layer is different from a material of the second dielectric layer and a material of the filling material layer.

Abstract: A method of identifying defects in crystals includes the following steps. A silicon carbide crystal to be identified for defects is sliced to obtain a test piece. An etching process is performed on the test piece. Etching conditions of the etching process includes the following. An etchant including potassium hydroxide is used, and etching is performed at a temperature of 400° C. to 550° C. in an environment where dry air or oxygen is introduced, so as to form etching pits of threading edge dislocations (TED) and threading screw dislocations (TSD) in the test piece. After the etching process is performed, a diameter ratio (TED/TSD) of the etching pits of the threading edge dislocations (TED) and the threading screw dislocations (TSD) observed by an optical microscope in the test piece is in a range of 0.2 to 0.5.

Abstract: A semiconductor structure and a manufacturing method thereof are provided. The semiconductor structure includes an interconnect structure disposed over a semiconductor substrate, contact pads disposed on the interconnect structure, a dielectric structure disposed on the interconnect structure and covering the contact pads, bonding connectors covered by the dielectric structure and landing on the contact pads, and a dummy feature covered by the dielectric structure and laterally interposed between adjacent two of the bonding connectors. Top surfaces of the bonding connectors are substantially coplanar with a top surface of the dielectric structure, and the bonding connectors are electrically coupled to the interconnect structure through the contact pads.

Abstract: A plating apparatus includes a workpiece holder, a plating bath, and a clamp ring. The plating bath is underneath the workpiece holder. The clamp ring is connected to the workpiece holder. The clamp ring includes channels communicating an inner surface of the clamp ring and an outer surface of the clamp ring.

Abstract: A system and method for utilizing metadata of a client computer in form of transactions and/or software operations (e.g., actions) in an enterprise system hosted by a host entity, such as in a cloud environment for testing the software operations is disclosed. The host entity stores metadata (e.g., response time, delay, processing time, usage) about the transactions in a database for the client computer system's actions. The host entity then uses the stored metadata to automatically generate a test script based on actual user interactions with the software operations of the enterprise resource planning system for specific data range and environment in order to test functionality of a plurality of software operations in the enterprise resource planning systems being operated by users of the client computers.

Abstract: A system and method for utilizing metadata of a client computer in form of transactions and/or software operations (e.g., actions) in an enterprise system hosted by a host entity, such as in a cloud environment for testing the software operations is disclosed. The host entity stores metadata (e.g., response time, delay, processing time, usage) about the transactions in a database for the client computer system's actions. The host entity then uses the stored metadata to automatically generate a test script based on actual user interactions with the software operations of the enterprise resource planning system for specific data range and environment in order to test functionality of a plurality of software operations in the enterprise resource planning systems being operated by users of the client computers.

Abstract: A system and method for utilizing metadata of a client computer in form of transactions and/or software operations (e.g., actions) in an enterprise system hosted by a host entity, such as in a cloud environment for testing the software operations is disclosed. The host entity stores metadata (e.g., response time, delay, processing time, usage) about the transactions in a database for the client computer system's actions. The host entity then uses the stored metadata to automatically generate a test script based on actual user interactions with the software operations of the enterprise resource planning system for specific data range and environment in order to test functionality of a plurality of software operations in the enterprise resource planning systems being operated by users of the client computers.

Abstract: The system and methods described herein monitor transactions occurring in any large complex enterprise software systems for simple or compound events that meet certain defined rules. Once events occur that successfully meet the criteria set out in each rule, then proactive notifications are sent to designated users. This enables early detection of suspicious transactions and also quick response in real-time.

Abstract: An enhanced door lock is capable of being locked from an inner side of a doorplate. At the outer lock portion, a ring seat and a C ring clamp two sides of the outer plate of the doorplate so as to enhance the structure of the doorplate to prevent the door lock from being pulled out. The inner cover is installed with a positioning hole. One side of a top of the control knob is drilled with a stud receiving groove. A positioning pin is placed in a stud receiving groove. The outer sleeve and the stud of the positioning pin are coupled with the stud receiving groove; then the bead resisting against the spring exactly pushes the positioning groove of the stud to resist against a positioning groove. By this structure, the lock is locked from the inner side of the doorplate.