Patents by Inventor Chen ITZIKOWITZ

Chen ITZIKOWITZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect detection of a semiconductor specimen
    Patent number: 12223641
    Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.
    Type: Grant
    Filed: May 19, 2022
    Date of Patent: February 11, 2025
    Assignee: Applied Materials Israel Ltd.
    Inventors: Boaz Dudovich, Assaf Ariel, Amir Bar, Lior Yehieli, Chen Itzikowitz, Shiran Ben Israel, Lior Katz, Eli Oren Joni, Eyal Rot
  • DEFECT DETECTION OF A SEMICONDUCTOR SPECIMEN
    Publication number: 20230377125
    Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.
    Type: Application
    Filed: May 19, 2022
    Publication date: November 23, 2023
    Inventors: Boaz DUDOVICH, Assaf ARIEL, Amir BAR, Lior YEHIELI, Chen ITZIKOWITZ, Shiran BEN ISRAEL, Lior KATZ, Eli Oren JONI, Eyal ROT