Patents by Inventor Chen-Li Sun

Chen-Li Sun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11768166
    Abstract: A system and a method for measuring a void fraction of an inside of a heat conduction member are provided. The system is used to measure the heat conduction member and includes: a heating device configured as a heat source to heat an evaporation end of the heat conduction member; a cooling device configured for cooling a condensation end of the heat conduction member; at least one pair of electrode pads respectively attached to two opposite surfaces of the heat conduction member; and an LCR meter electrically connected to the at least one pair of the electrode pads for measuring impedances of the heat conduction member. Each of the impedances is converted into the void fraction that corresponds to a measured position of the heat conduction member.
    Type: Grant
    Filed: November 18, 2021
    Date of Patent: September 26, 2023
    Assignee: NATIONAL TAIWAN UNIVERSITY
    Inventors: Chen-Li Sun, Yu-Hsiang Liu, Yu-Jen Lien
  • Publication number: 20220291161
    Abstract: A system and a method for measuring a void fraction of an inside of a heat conduction member are provided. The system is used to measure the heat conduction member and includes: a heating device configured as a heat source to heat an evaporation end of the heat conduction member; a cooling device configured for cooling a condensation end of the heat conduction member; at least one pair of electrode pads respectively attached to two opposite surfaces of the heat conduction member; and an LCR meter electrically connected to the at least one pair of the electrode pads for measuring impedances of the heat conduction member. Each of the impedances is converted into the void fraction that corresponds to a measured position of the heat conduction member.
    Type: Application
    Filed: November 18, 2021
    Publication date: September 15, 2022
    Inventors: CHEN-LI SUN, YU-HSIANG LIU, YU-JEN LIEN
  • Patent number: 9140641
    Abstract: A fluid analysis method is provided. A gradient distribution of a first scalar property of a calibration fluid in a space is obtained. A calibration schlieren image of the calibration fluid is acquired and processed to obtain an intensity distribution of the calibration schlieren image. The gradient distribution of the first scalar property of the calibration fluid in the space is mapped to the intensity distribution of the calibration schlieren image, so as to obtain a corresponding relation between the gradients of the first scalar property and the intensities. A test schlieren image of a test fluid is acquired and processed to obtain intensity distribution of the test schlieren image. The intensity distribution of the test schlieren image is converted to the gradient distribution of the first scalar property of the test fluid according to the corresponding relation. Moreover, a fluid analysis system is also provided.
    Type: Grant
    Filed: December 20, 2013
    Date of Patent: September 22, 2015
    Assignee: National Taiwan University
    Inventors: Chen-Li Sun, Tzu-Hsun Hsiao, Chien-Yuan Huang
  • Publication number: 20150048264
    Abstract: A fluid analysis method is provided. A gradient distribution of a first scalar property of a calibration fluid in a space is obtained. A calibration schlieren image of the calibration fluid is acquired and processed to obtain an intensity distribution of the calibration schlieren image. The gradient distribution of the first scalar property of the calibration fluid in the space is mapped to the intensity distribution of the calibration schlieren image, so as to obtain a corresponding relation between the gradients of the first scalar property and the intensities. A test schlieren image of a test fluid is acquired and processed to obtain intensity distribution of the test schlieren image. The intensity distribution of the test schlieren image is converted to the gradient distribution of the first scalar property of the test fluid according to the corresponding relation. Moreover, a fluid analysis system is also provided.
    Type: Application
    Filed: December 20, 2013
    Publication date: February 19, 2015
    Applicant: National Taiwan University
    Inventors: Chen-Li Sun, Tzu-Hsun Hsiao, Chien-Yuan Huang