Patents by Inventor Chen-Ping Wen

Chen-Ping Wen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing device
    Patent number: 6809544
    Abstract: A device for testing liquid crystal display (LCD) prior to the installation of a drive chip is provided. The device at least includes a testing platform, a slope adjusting device, and a height adjusting device, wherein the slope adjusting device is used to adjust the slope of the testing platform while the height adjusting device is used to adjust the height of the testing platform. The testing platform is further equipped with rectangular fasteners with which the LCD can be fastened and a signal outputting device. The signal outputting device has a horizontal shifter which is fixed onto the testing platform, a vertical shifter which is coupled to the horizontal shifter, and a plurality of probes which are coupled to the vertical shifter, wherein the horizontal shifter and the vertical shifter can enable these probes to move along a plane perpendicular to the testing plane.
    Type: Grant
    Filed: July 7, 2003
    Date of Patent: October 26, 2004
    Assignee: Au Optronics Corp.
    Inventors: Richard Liao, Mao-Chi Hou, Hsin-Yu Lin, Chen-Ping Wen
  • Testing device
    Publication number: 20040155673
    Abstract: A device for testing liquid crystal display (LCD) prior to the installation of a drive chip is provided. The device at least includes a testing platform, a slope adjusting device, and a height adjusting device, wherein the slope adjusting device is used to adjust the slope of the testing platform while the height adjusting device is used to adjust the height of the testing platform. The testing platform is further equipped with rectangular fasteners with which the LCD can be fastened and a signal outputting device. The signal outputting device has a horizontal shifter which is fixed onto the testing platform, a vertical shifter which is coupled to the horizontal shifter, and a plurality of probes which are coupled to the vertical shifter, wherein the horizontal shifter and the vertical shifter can enable these probes to move along a plane perpendicular to the testing plane.
    Type: Application
    Filed: July 7, 2003
    Publication date: August 12, 2004
    Inventors: Richard Liao, Mao-Chi Hou, Hsin-Yu Lin, Chen-Ping Wen