Abstract: A radiation image detector with automatic exposure detection includes a high voltage circuit unit for providing an operation bias. An image sensing panel includes semiconductor multi-layer structure, receives the operation bias and senses an incident X-ray, and produces holes and electrons. The holes produce positive charges for forming an image. An automatic exposure detector is coupled to the high voltage circuit unit to transfer the operation bias and detects variation pattern with time of a voltage signal or a current signal induced by the electrons to determine an onset time or a cessation time for exposure. A control unit couples to the high voltage circuit unit, the image sensing panel, and the automatic exposure detector and configured to perform system control, including obtaining an image signal from the image sensing panel. An imaging unit couples to the control unit to process the image signal and display and store the image.

Abstract: A radiation image detector with automatic exposure detection includes a high voltage circuit unit for providing an operation bias. An image sensing panel includes semiconductor multi-layer structure, receives the operation bias and senses an incident X-ray, and produces holes and electrons. The holes produce positive charges for forming an image. An automatic exposure detector is coupled to the high voltage circuit unit to transfer the operation bias and detects variation pattern with time of a voltage signal or a current signal induced by the electrons to determine an onset time or a cessation time for exposure. A control unit couples to the high voltage circuit unit, the image sensing panel, and the automatic exposure detector and configured to perform system control, including obtaining an image signal from the image sensing panel. An imaging unit couples to the control unit to process the image signal and display and store the image.