Abstract: A light-emitting device includes a substrate, a semiconductor epitaxial structure, and an etch stop layer. The substrate has a first surface and a second surface opposite to the first surface. The semiconductor epitaxial structure has a side surface that has a roughened structure formed with protrusions, and includes a first type semiconductor layer, an active layer, and a second type semiconductor layer disposed on the first surface of the substrate in such order. The etch stop layer is disposed on a surface of the semiconductor epitaxial structure away from the substrate for preventing an etching solution from etching the semiconductor epitaxial structure. A light-emitting package and a light-emitting apparatus are also provided. A method for manufacturing a light-emitting device is also provided.

Abstract: A testing method and an apparatus applied to an IP phone system for testing an electronic device is provided. The electronic device has a true table and signal ports. The electronic device is connected to a power generating jig and an IP phone simulator via a cable. A power generated by the power generating jig is provided. A first value power command issued by the IP phone simulator is provided. Whether the electronic device is able to correctly control the signal ports in response to the first value power command and the true table is determined. A second value power command issued by the IP phone simulator is provided. Whether the electronic device is able to correctly control the signal ports in response to the second value power command and the true table is determined. If so, it is concluded that the electronic device passes the test.

Abstract: A testing method and an apparatus applied to an IP phone system for testing an electronic device is provided. The electronic device has a true table and signal ports. The electronic device is connected to a power generating jig and an IP phone simulator via a cable. A power generated by the power generating jig is provided. A first value power command issued by the IP phone simulator is provided. Whether the electronic device is able to correctly control the signal ports in response to the first value power command and the true table is determined. A second value power command issued by the IP phone simulator is provided. Whether the electronic device is able to correctly control the signal ports in response to the second value power command and the true table is determined. If so, it is concluded that the electronic device passes the test.