Abstract: A computer-implemented method, a computer system, and computer program product for associating security events. The method includes obtaining a result of implementation of one or more Locality-Sensitive Hashing (LSH) functions to feature data of a first event detected by a first device. The method also includes mapping the result to one or more positions in a data structure. In response to data elements of the one or more positions indicating first information associating with the one or more positions exists in a storage, the method includes obtaining the first information from the storage. The method further includes sending the first information to the first device.

Abstract: An automatic measuring method for measuring connecting lines includes the steps of: S1, loading setting parameters and measuring regulations corresponding to the connecting lines into an automatic measuring apparatus; S2, receiving triggering signals to start measuring; and S3, automatically controlling measuring signals according to the setting parameters to measure multiple pairs of leads of the connecting lines one by one, and then determining whether the quality of the connecting lines is in compliance with standard regulations or not. Besides, an automatic measuring apparatus corresponding to the method is provided as well. The automatic measuring method and the apparatus are suitable for meeting the requirements of product measuring in mass production due to short time and high efficiency.

Abstract: Provided are a system and method for preventing contamination in a semiconductor manufacturing environment. The method includes comparing one or more attributes associated with a product, such as a substrate, with one or more attributes associated with an operation. If the comparison indicates that the product is not compatible with the operation, then the operation is suspended with respect to the product. If the comparison indicates that the product is compatible with the operation, then the operation is performed on the product.

Abstract: Provided are a system and method for preventing contamination in a semiconductor manufacturing environment. The method includes comparing one or more attributes associated with a product, such as a substrate, with one or more attributes associated with an operation. If the comparison indicates that the product is not compatible with the operation, then the operation is suspended with respect to the product. If the comparison indicates that the product is compatible with the operation, then the operation is performed on the product.