Abstract: An inspecting tool for inspecting a micro LED array panel (00) comprises: an optical collector group (01) configured to collect light emitted from a micro LED array included in the micro LED array panel (00): an image detector (02) connected with the optical collector group (01) to receive the light collected by the optical collector group (01) and to capture an image of the micro LED array: and. a light measuring device (03) electrically connected with the optical collector group (01) to receive the light collected by the optical collector group (01) and to measure the light emitted from one or more portions of the micro LED array.

Abstract: A micro projector and a semiconductor wafer are provided. The micro projector includes a micro LED array display chip; and a lens group provided above the micro LED array display chip and supported by a bottom connector. The semiconductor wafer includes a micro LED wafer including a plurality of micro LED array display chips; and a plurality of lens wafers stacked on the micro LED wafer to form a micro projector array.

Abstract: An adapter device for chip packaging test is disclosed in the present disclosure. The adapter device for chip packaging test includes: a connection plate comprising a plurality of packaging testing units. Each packaging testing unit includes: a plate slot for accommodating a micro chip, a signal transmission sheet coupled with the plate slot, a signal connector coupled with the plate slot, and a chip substrate. In some embodiments, the adapter device for chip packaging test further includes: an adapter plate coupled with the connection plate through an inter-plate connection region included in the adapter plate. A method for chip packaging testing includes bonding a plurality of the micro chips to the chip substrates of the connection plate, coupling the connection plate with the adapter plate, inspecting the plurality of micro chips, and identifying a faulty micro chip using the identification code.

Abstract: A micro display module includes an X-cube prism configured to combine two or more monochrome images into a polychromatic image; and at least two micro-LED (light emitting diode) display panels configured to provide the two or more monochrome images for the X-cube prism, wherein each of the micro-LED display panels is adhered to a corresponding one of surfaces of the X-cube prism.

Abstract: An inspecting tool for inspecting a micro LED array panel (00) comprises: an optical collector group (01) configured to collect light emitted from a micro LED array included in the micro LED array panel (00): an image detector (02) connected with the optical collector group (01) to receive the light collected by the optical collector group (01) and to capture an image of the micro LED array: and. a light measuring device (03) electrically connected with the optical collector group (01) to receive the light collected by the optical collector group (01) and to measure the light emitted from one or more portions of the micro LED array.

Abstract: A method of constructing a defect level classification model of a micro LED array panel includes: defining a defect classification rule for classifying pixel defects; detecting a pixel defect of the micro LED array panel; identifying a pixel defect type of the detected pixel defect according to the defect classification rule; and, identifying a defect level of the micro LED array panel according to a defect level classification rule and the identified pixel defect type.

Abstract: An inspecting tool for inspecting a micro LED array panel (00) includes: an optical collector group (01) configured to collect light emitted from a micro LED array included in the micro LED array panel (00); an image detector (02) connected with the optical collector group (01) to receive the light collected by the optical collector group (01), and configured to capture an image of the micro LED array; and a light measuring device (03) electrically connected with the optical collector group (01) receive the light collected by the optical collector group (01), and configured to measure the light emitted from one or more portions of the micro LED array. The optical collector group (01) is configured to receive the light emitted from any position of the micro LED array.

Abstract: The present invention relates to a full length humanized monoclonal antibody that can specifically bind to VEGF. The antibody can inhibit binding of VEGF to VEGFR-1 and VEGFR-2, thereby inhibiting signaling of VEGF. The antibody has a strong affinity for VEGF, has a long half-life, and is highly safe after vitreous injection. The antibody of the invention may be effective in treating diseases associated with VEGF overexpression, particularly diseases associated with abnormal angiogenesis caused by VEGF overexpression.

Abstract: Provided are bispecific antibodies having a full-size antibody portion with two light chains and two heavy chains, wherein the two heavy chains each is fused to a single-chain variable fragment (scFv) portion. In certain embodiments, the full-size antibody has specificity to EGFR and the scFv has specificity to VEGF.

Abstract: Provided are bispecific antibodies having a full-size antibody portion with two light chains and two heavy chains, wherein the two heavy chains each is fused to a single-chain variable fragment (scFv) portion. In certain embodiments, the full-size antibody has specificity to EGFR and the scFv has specificity to VEGF.