Abstract: A memory control method, a memory storage device, and a memory control circuit unit are provided. The method includes: executing a single page encoding operation on first data stored in a first type physical unit to generate local parity data; executing a global encoding operation on second data stored in at least two of the first type physical unit, a second type physical unit, and a third type physical unit to generate global parity data; reading the second data from the at least two of the first type physical unit, the second type physical unit, and the third type physical unit in response to a failure of a single page decoding operation for the first data; and executing a global decoding operation on the second data according to the global parity data.

Abstract: A memory control method, a memory storage device, and a memory control circuit unit are provided. The method includes: executing a single page encoding operation on first data stored in a first type physical unit to generate local parity data; executing a global encoding operation on second data stored in at least two of the first type physical unit, a second type physical unit, and a third type physical unit to generate global parity data; reading the second data from the at least two of the first type physical unit, the second type physical unit, and the third type physical unit in response to a failure of a single page decoding operation for the first data; and executing a global decoding operation on the second data according to the global parity data.

Abstract: A decoding method, a memory control circuit unit, and a memory storage device are provided. The method includes: configuring a plurality of read voltage categories, wherein the read voltage categories respectively have a plurality of representative read voltage sets; reading a first physical programming unit according to the representative read voltage sets and executing a decoding operation to obtain a plurality of decoded information; choosing a first read voltage category according to the plurality of decoded information; and reading the first physical programming unit according to the first read voltage sets in the first read voltage category and executing the decoding operation.

Abstract: A decoding method for a memory storage device including a rewritable non-volatile memory module is provided according to an exemplary embodiment of the invention. The method includes: reading at least one memory cells by using at least one read voltage level to obtain a codeword; performing a parity check operation on the codeword by an error checking and correcting circuit to generate a syndrome sum corresponding to the codeword; and dynamically adjusting a first parameter used by the error checking and correcting circuit in a first decoding operation based on whether the syndrome sum is less than a first threshold value and performing the first decoding operation on the codeword by the error checking and correcting circuit by using the first parameter.

Abstract: A decoding method for a memory storage device including a rewritable non-volatile memory module is provided according to an exemplary embodiment of the invention. The method includes: reading at least one memory cells by using at least one read voltage level to obtain a codeword; performing a parity check operation on the codeword by an error checking and correcting circuit to generate a syndrome sum corresponding to the codeword; and dynamically adjusting a first parameter used by the error checking and correcting circuit in a first decoding operation based on whether the syndrome sum is less than a first threshold value and performing the first decoding operation on the codeword by the error checking and correcting circuit by using the first parameter.

Abstract: In one exemplary embodiment, the decoding method includes: reading first data from a plurality of first memory cells of a rewritable non-volatile memory module; performing a first decoding operation on the first data based on a first decoding condition; and performing a second decoding operation on the first data based on a second decoding condition if the first decoding operation conforms to a first default status, where a strict level of locating an error bit in the first data based on the second decoding condition is higher than a strict level of locating the error bit in the first data based on the first decoding condition. Therefore, a decoding efficiency of a memory storage device can be improved.

Abstract: A data processing method, a memory storage device and a memory control circuit unit are provided. The method includes: receiving first write data; performing a first stage encoding operation of a low-density parity-check (LDPC) code on the first write data and generating first transition data; performing a second stage encoding operation of the LDPC code on the first transition data and generating a first error correcting code (ECC); receiving second write data; and performing the first stage encoding operation of the LDPC code on the second write data during a time period of performing the second stage encoding operation of the LDPC code on the first transition data. Accordingly, the data processing efficiency corresponding to the LDPC code can be improved.

Abstract: A decoding method, a memory storage device and a memory control circuit unit. The method includes: reading a plurality of bits from a plurality of first memory cells; performing a first decoding operation on the bits according to first reliability information; and performing a second decoding operation on the bits according to second reliability information if the first decoding operation fails and meets a default condition, and the second reliability information is different from the first reliability information, and a correction ability of the second reliability information for a first type error of the bits is higher than a correction ability of the first reliability information for the first type error. In addition, the first type error is generated by performing a specific programming operation on the first memory cells based on error data.

Abstract: A decoding method, a memory storage device and a memory control circuit unit. The method includes: reading a plurality of bits from a plurality of first memory cells; performing a first decoding operation on the bits according to first reliability information; and performing a second decoding operation on the bits according to second reliability information if the first decoding operation fails and meets a default condition, and the second reliability information is different from the first reliability information, and a correction ability of the second reliability information for a first type error of the bits is higher than a correction ability of the first reliability information for the first type error. In addition, the first type error is generated by performing a specific programming operation on the first memory cells based on error data.

Abstract: In one exemplary embodiment, the decoding method includes: reading first data from a plurality of first memory cells of a rewritable non-volatile memory module; performing a first decoding operation on the first data based on a first decoding condition; and performing a second decoding operation on the first data based on a second decoding condition if the first decoding operation conforms to a first default status, where a strict level of locating an error bit in the first data based on the second decoding condition is higher than a strict level of locating the error bit in the first data based on the first decoding condition. Therefore, a decoding efficiency of a memory storage device can be improved.

Abstract: A data processing method, a memory storage device and a memory control circuit unit are provided. The method includes: receiving first write data; performing a first stage encoding operation of a low-density parity-check (LDPC) code on the first write data and generating first transition data; performing a second stage encoding operation of the LDPC code on the first transition data and generating a first error correcting code (ECC); receiving second write data; and performing the first stage encoding operation of the LDPC code on the second write data during a time period of performing the second stage encoding operation of the LDPC code on the first transition data. Accordingly, the data processing efficiency corresponding to the LDPC code can be improved.

Abstract: A decoding method, a memory storage device and a memory control circuit unit are provided. The method includes: reading data from a plurality of first memory cells of a rewritable non-volatile memory module; estimating an error bit occurrence rate of the data before performing a first decoding process on the data; and performing the first decoding process on the data by using a first decoding parameter according to the estimated error bit occurrence rate, wherein the first decoding parameter corresponds to a strict level for locating an error bit in the first decoding process. As a result, a decoding efficiency of the memory storage device can be improved.

Abstract: A dye-sensitized solar cell (DSSC) comprising nanoparticles formed on a surface of a nanowire formed on a substrate and a method of fabricating the same is disclosed. The dye-sensitized solar cell comprises a first substrate. A nanowire is formed on the first substrate. A plurality of nanoparticles is then contacted with a surface of the nanowire. The dye-sensitized solar cell further comprises a dye adsorbed onto a surface of the nanoparticles. A second substrate is corresponded to the first substrate. Finally, an electrolyte is filled between the first substrate and the second substrate, and in contact with the dye and nanoparticles. The nanoparticles are bonded to the surface of nanowire to extend and increase surface contact with the dye for promoting cell efficiency (?) of the dye-sensitized solar cell.