Patents by Inventor Cheng-Chia Huang

Cheng-Chia Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080278669
    Abstract: A twisted nematic liquid crystal display (TN-LCD) structure is provided, which includes a twisted nematic (TN) liquid crystal layer, a first laminated polarizing film, and a second laminated polarizing film. The first laminated polarizing film and the second laminated polarizing film are respectively disposed on a first side and a second side of the TN liquid crystal layer. By means of an angle formed between a first absorption axis of a first linear polarizing film for the first laminated polarizing film and a second absorption axis of a second linear polarizing film for the second laminated polarizing film, the LCD structure of the present invention has the efficacy of an enlarged view angle, improved contrast, and low cost.
    Type: Application
    Filed: December 27, 2007
    Publication date: November 13, 2008
    Applicant: SUMIKA TECHNOLOGY INC.
    Inventors: Cheng Chia HUANG, Wen-Hao CHAN
  • Publication number: 20070281075
    Abstract: A method to monitor a nanocrystalline film surface structure and the thickness thereof uses the surface structure characteristics of the vapor deposition nanocrystalline thin films having the low volume fraction to make a nanocrystalline thin film become a nonhomogeneous double-layer structure comprising a dense bottom layer having high index of refraction and a surface layer having the low volume fraction. The optical module of this double-layer structure can be used to simulate the characteristics of the nanocrystalline structure. That is to say, in the thin film deposition manufacturing process, if the thin film structure satisfies the optical module of the double-layer structure, this means it has the nanocrystalline characteristic. Hence, in the manufacturing process, use the optical instruments to measure the thin film and the substrate and to calculate the optical parameters; thus a nanocrystalline film surface structure and the thickness thereof can be precisely monitored immediately.
    Type: Application
    Filed: May 31, 2006
    Publication date: December 6, 2007
    Inventor: Cheng-Chia Huang
  • Patent number: D786889
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: May 16, 2017
    Assignees: Patentcloud Corporation, Patentcloud Co. Limited
    Inventor: Cheng-Chia Huang
  • Patent number: D787529
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: May 23, 2017
    Assignees: Patentcloud Corporation, Patentcloud Co. Limited
    Inventor: Cheng-Chia Huang
  • Patent number: D787530
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: May 23, 2017
    Assignees: Patentcloud Corporation, Patentcloud Co. Limited
    Inventor: Cheng-Chia Huang
  • Patent number: D819057
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: May 29, 2018
    Assignees: Patentcloud Corporation, Patentcloud Co. Limited
    Inventor: Cheng-Chia Huang
  • Patent number: D840411
    Type: Grant
    Filed: September 30, 2015
    Date of Patent: February 12, 2019
    Assignees: Patentcloud Corporation, Patentcloud Co. Limited
    Inventor: Cheng-Chia Huang