Patents by Inventor Cheng-Jong Chang

Cheng-Jong Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for measuring and correcting aberration of an eye
    Patent number: 7762666
    Abstract: A device and method for measuring and correcting eye aberrations integrate wavefront sensing, wavefront aberration correction and optometric testing into one another and configure the optical paths of wavefront sensing and optometric testing as aplanatic structures, such that under optometric testing conditions both wavefront sensing and aberration correction can be performed simultaneously, and final optometric testing is conducted on wavefront aberration-corrected optometric parameters to verify if the wavefront aberration-corrected optometric parameters fall within normal visual range, thus ensuring the accuracy and high repetition of the measured optometric parameters.
    Type: Grant
    Filed: September 25, 2008
    Date of Patent: July 27, 2010
    Assignee: Industrial Technology Research Institute
    Inventors: Chuan-Chung Chang, Cheng-Jong Chang
  • DEVICE FOR MEASURING AND CORRECTING ABERRATION OF AN EYE
    Publication number: 20090021696
    Abstract: A device and method for measuring and correcting eye aberrations integrate wavefront sensing, wavefront aberration correction and optometric testing into one another and configure the optical paths of wavefront sensing and optometric testing as aplanatic structures, such that under optometric testing conditions both wavefront sensing and aberration correction can be performed simultaneously, and final optometric testing is conducted on wavefront aberration-corrected optometric parameters to verify if the wavefront aberration-corrected optometric parameters fall within normal visual range, thus ensuring the accuracy and high repetition of the measured optometric parameters.
    Type: Application
    Filed: September 25, 2008
    Publication date: January 22, 2009
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chuan-Chung Chang, Cheng-Jong Chang
  • Method and device for measuring and correcting aberrations of eye
    Publication number: 20070109497
    Abstract: A device and method for measuring and correcting eye aberrations integrate wavefront sensing, wavefront aberration correction and optometric testing into one another and configure the optical paths of wavefront sensing and optometric testing as aplanatic structures, such that under optometric testing conditions both wavefront sensing and aberration correction can be performed simultaneously, and final optometric testing is conducted on wavefront aberration-corrected optometric parameters to verify if the wavefront aberration-corrected optometric parameters fall within normal visual range, thus ensuring the accuracy and high repetition of the measured optometric parameters.
    Type: Application
    Filed: June 13, 2006
    Publication date: May 17, 2007
    Inventors: Chuan-Chung Chang, Cheng-Jong Chang