Patents by Inventor Cheng-Li Chuang

Cheng-Li Chuang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7905383
    Abstract: A metal layer such as copper, silver or nickel is coated on a surface of reinforcement particles (aluminum oxide or silicon carbide powder) by electroless plating technique. The metal-coated reinforcement particles with an appropriate volume fraction are inserted into the gap between two metal plates or two metal matrix composite (MMC) plates. The reinforcement particles are stirred into the metal plates or the MMC plates by friction stir welding (FSW) to form a butt weld metal containing reinforcement particles. Or the metal-coated reinforcement particles deposited on the surface of the metal plates or the MMC plates and then are stirred into base material of the metal plates. The metal-coated reinforcement particles are uniformly distributed in a weld metal by such stirring, the coated metal layer on the surface of the reinforcement particles form an alloy with metallurgical bonding.
    Type: Grant
    Filed: December 22, 2009
    Date of Patent: March 15, 2011
    Assignee: Chung Shan Institute of Science and Technology, Armaments Bureau, M.N.D.
    Inventors: Shan Torng, Jong-Ning Aoh, Ji-Wei Huang, Cheng-Li Chuang, Sy-Cherng Yang, Yue-Poe Huang
  • Patent number: 7326640
    Abstract: Disclosed is a method of realizing thermosonic wire bonding between metal wires and copper pads by depositing a thin film to surfaces of semiconductor chips with copper pads, where a thin film that provides the effect of self-passivation to prevent oxidization of the copper pads located thereunder is deposited on surfaces of the copper pads to provide sufficient protection to the chips with copper pads thereby preventing copper from oxidizing at elevated temperature during packaging, due to die sawing, die mounting or curing and thermosonic wire bonding, which would result in failure of bonding metal wires to the copper pads, poor bondability between the metal wires and the copper pads, or low bonding strength of the bonds.
    Type: Grant
    Filed: July 13, 2005
    Date of Patent: February 5, 2008
    Assignee: National Chung Cheng University
    Inventors: Jong-Ning Aoh, Cheng-Li Chuang
  • Publication number: 20070015352
    Abstract: Disclosed is a method of realizing thermosonic wire bonding between metal wires and copper pads by depositing a thin film to surfaces of semiconductor chips with copper pads, where a thin film that provides the effect of self-passivation to prevent oxidization of the copper pads located thereunder is deposited on surfaces of the copper pads to provide sufficient protection to the chips with copper pads thereby preventing copper from oxidizing at elevated temperature during packaging, due to die sawing, die mounting or curing and thermosonic wire bonding, which would result in failure of bonding metal wires to the copper pads, poor bondability between the metal wires and the copper pads, or low bonding strength of the bonds.
    Type: Application
    Filed: July 13, 2005
    Publication date: January 18, 2007
    Inventors: Jong-Ning Aoh, Cheng-Li Chuang
  • Publication number: 20070010083
    Abstract: Discloses is a method of realizing direct bonding between metal wires and copper pads by means of thermosonic wire bonding using a shielding gas spraying device, where a shielding gas is provided between metal wires and a chip with copper pads during thermosonic wire bonding to form a gas shielding zone around a wire bonding zone of a thermosonic wire bonder, to effectively prevent oxidization of the chips with copper pads at elevated temperature of a heating stage of the thermosonic wire bonder; thus, the provision of the shielding gas spraying device according to this invention allows the metal wires to be directly bonded to the chips with copper pads by means of thermosonic wire bonding process, and overcomes the problem caused by the copper oxide film, thereby meeting the demand of high bondability required by the semiconductor packaging industry, and significantly improving the bonding strength and reliability of the metal wires and chip with copper pads.
    Type: Application
    Filed: July 7, 2005
    Publication date: January 11, 2007
    Inventors: Jong-Ning Aoh, Cheng-Li Chuang