Abstract: The present disclosure provides a semiconductor processing apparatus according to one embodiment. The semiconductor processing apparatus includes a chamber; a base station located in the chamber for supporting a semiconductor substrate; a preheating assembly surrounding the base station; a first heating element fixed relative to the base station and configured to direct heat to the semiconductor substrate; and a second heating element moveable relative to the base station and operable to direct heat to a portion of the semiconductor substrate.

Abstract: A data analysis method for optimization of aluminum anodizing and dyeing process acquires a plurality of sample data groups, each sample data groups comprising dyeing result data and parameter data of multiple processing parameters. Contribution value of each processing parameter data relative to the dyeing result data in each of the plurality of sample data groups is determined, and the contribution values are used to determine at least one essential processing parameter. The essential processing parameters are then adjusted according to a data analysis result for improving quality of products. A computing device and storage medium are also provided.

Abstract: A system and a method for detecting welding based on edge computing, the system includes at least one edge server, each edge server configured to obtain welding information of at least one welding machine, preprocess the welding information to generate processed data, input the processed data to a trained algorithm to generate a detecting result, and determine a welding quality of the welding machine according to the detecting result; and a data server coupled to the at least one edge server and configured to process and store the detecting result and the welding information uploaded by each edge server, generate display information, and visualizes the detecting result according to the display information.

Abstract: A method for analyzing reliability of facility implemented in an electronic device. The method includes obtaining alarm data from at least one equipment; generating a first prediction parameter and a first algorithm model based on the alarm data and a first model; generating a second prediction parameter and a second algorithm model based on the alarm data and a second model; determining that the first algorithm model is better than the second algorithm model based on a judgment model, the first prediction parameter, and the second prediction parameter; and generating an evaluation index based on the first algorithm model, so as to evaluate the reliability of the at least one equipment based on the evaluation index, when the first algorithm model is determined to be better than the second algorithm model.

Abstract: A method for detecting welding defects of workpieces includes obtaining a first image from an image capturing element; extracting welding information from the first image; transmitting the welding information to a logic processing element to obtain welding defects; the logic processing element formed by evolution of self-learning of historical welding information; and generating display information of the welding defects and displaying visual form and/or characteristics values of the welding defects. An apparatus and a non-transitory computer readable medium for detecting welding defects of workpieces are also disclosed.