Patents by Inventor Cheng-Ming Chiang

Cheng-Ming Chiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250043045
    Abstract: A method for preparing a long-chain branched polypropylene includes subjecting a T-reagent to a polymerization reaction with propylene in the presence of a catalyst composition. The catalyst composition includes an alkylaluminoxane and a metallocene-based catalyst. The metallocene-based catalyst contains a metal selected from the group consisting of titanium (Ti), zirconium (Zr), and hafnium (Hf). The T-reagent having an alkenyl silyl functional group is selected from the group consisting of 1,2-bis[dimethyl(vinyl)silyl]ethane, dimethyldivinylsilane, 7-octenyldimethyl(vinyl)silane, 7-octenyldimethyl(allyl)silane, 4-(but-3-enyl)phenyldimethyl(vinyl)silane, 4-(but-3-enyl)phenyldimethyl(allyl)silane, and combinations thereof.
    Type: Application
    Filed: July 30, 2024
    Publication date: February 6, 2025
    Inventors: Jing-Cherng Tsai, Kwang-Ming Chen, Jung-Hung Kao, Kun-Pei Hsieh, Chao-Shun Chang, Hsing-Chun Chen, Chun-Wei Chiu, Cheng-Hung Chiang, Yu-Chuan Sung, Shang-Lin Tsai, Yu-Sheng Lin
  • Patent number: 7274544
    Abstract: The present disclosure is directed toward electrostatic device protection for semiconductor devices. A circuit for providing electro-static discharge (ESD) protection for a semiconductor circuit may comprise a first circuit coupled to a voltage bus and to the gate of a first transisto, the first circuit comprising a metal-oxide semiconductor (MOS) transistor; and a second circuit coupled to the voltage bus, to ground, and to the gate of the transistor of the first circuit. The MOS transistor of the first circuit may be a PMOS transistor whose source is coupled to the voltage bus, whose drain is coupled to the gate of the first transistor, whose gate is coupled to the second circuit, and whose well is coupled to a floating N-well.
    Type: Grant
    Filed: October 21, 2004
    Date of Patent: September 25, 2007
    Assignee: Taiwan Semiconductor Manufacturing Company
    Inventors: Ker-Min Chen, Cheng-Ming Chiang
  • Publication number: 20060087779
    Abstract: The present disclosure is directed toward electrostatic device protection for semiconductor devices. A circuit for providing electro-static discharge (ESD) protection for a semiconductor circuit may comprise a first circuit coupled to a voltage bus and to the gate of a first transisto, the first circuit comprising a metal-oxide semiconductor (MOS) transistor; and a second circuit coupled to the voltage bus, to ground, and to the gate of the transistor of the first circuit. The MOS transistor of the first circuit may be a PMOS transistor whose source is coupled to the voltage bus, whose drain is coupled to the gate of the first transistor, whose gate is coupled to the second circuit, and whose well is coupled to a floating N-well.
    Type: Application
    Filed: October 21, 2004
    Publication date: April 27, 2006
    Inventors: Ker-Min Chen, Cheng-Ming Chiang