Patents by Inventor Cheng-Shao Chen

Cheng-Shao Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing device for burn-in test operations and control method thereof
    Patent number: 11531059
    Abstract: A control method is provided and used to place a target object on a test platform in a cabin of a testing device, to sense the temperature of the target object by a temperature response structure, and then to receive temperature signals of the temperature response structure by a controller, where the controller can regulate the pressure inside the cabin to control the air pressure of the cabin, so that the target object can still maintain good heat dissipation under high power consumption.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: December 20, 2022
    Assignee: SILICONWARE PRECISION INDUSTRIES CO., LTD.
    Inventors: Chao-Ming Tu, Chih-Ming Yang, Wen-Chin Liang, Cheng-Shao Chen, Yung-Ming Wang
  • Testing device and method
    Patent number: 11513152
    Abstract: Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.
    Type: Grant
    Filed: February 4, 2021
    Date of Patent: November 29, 2022
    Assignee: SILICONWARE PRECISION INDUSTRIES CO., LTD.
    Inventors: Wen-Chin Liang, Po-Wen Hsiao, Cheng-Tsai Hsieh, Cheng-Shao Chen
  • TESTING DEVICE AND CONTROL METHOD THEREOF
    Publication number: 20220214395
    Abstract: A control method is provided and used to place a target object on a test platform in a cabin of a testing device, to sense the temperature of the target object by a temperature response structure, and then to receive temperature signals of the temperature response structure by a controller, where the controller can regulate the pressure inside the cabin to control the air pressure of the cabin, so that the target object can still maintain good heat dissipation under high power consumption.
    Type: Application
    Filed: February 8, 2021
    Publication date: July 7, 2022
    Applicant: SILICONWARE PRECISION INDUSTRIES CO., LTD.
    Inventors: Chao-Ming Tu, Chih-Ming Yang, Wen-Chin Liang, Cheng-Shao Chen, Yung-Ming Wang
  • TESTING DEVICE AND METHOD
    Publication number: 20220196731
    Abstract: Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.
    Type: Application
    Filed: February 4, 2021
    Publication date: June 23, 2022
    Applicant: SILICONWARE PRECISION INDUSTRIES CO., LTD.
    Inventors: Wen-Chin Liang, Po-Wen Hsiao, Cheng-Tsai Hsieh, Cheng-Shao Chen
  • Automated antenna testing device
    Patent number: 10945140
    Abstract: An automated antenna testing device is disclosed. A carrying stand for objects-to-be-tested to be carried thereon, and an antenna stand corresponding to the carrying stand are installed in a receiving space of a cavity part on a machine part, and a conveyance device for moving the objects-to-be-tested to the carrying stand is installed on the machine part. The conveyance device and the cavity part are installed independently, therefore, an OTA testing environment can be prevented from being affected by external factors.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: March 9, 2021
    Assignee: Siliconware Precision Industries Co., Ltd.
    Inventors: Cheng-Tsai Hsieh, Cheng-Shao Chen
  • AUTOMATED ANTENNA TESTING DEVICE
    Publication number: 20210067982
    Abstract: An automated antenna testing device is disclosed. A carrying stand for objects-to-be-tested to be carried thereon, and an antenna stand corresponding to the carrying stand are installed in a receiving space of a cavity part on a machine part, and a conveyance device for moving the objects-to-be-tested to the carrying stand is installed on the machine part. The conveyance device and the cavity part are installed independently, therefore, an OTA testing environment can be prevented from being affected by external factors.
    Type: Application
    Filed: October 7, 2019
    Publication date: March 4, 2021
    Inventors: Cheng-Tsai Hsieh, Cheng-Shao Chen