Patents by Inventor Cheng-Ying Huang
Cheng-Ying Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240145557Abstract: A device is disclosed. The device includes a first epitaxial region, a second epitaxial region, a first gate region between the first epitaxial region and a second epitaxial region, a first dielectric structure underneath the first epitaxial region, a second dielectric structure underneath the second epitaxial region, a third epitaxial region underneath the first epitaxial region, a fourth epitaxial region underneath the second epitaxial region, and a second gate region between the third epitaxial region and a fourth epitaxial region and below the first gate region. The device also includes, a conductor via extending from the first epitaxial region, through the first dielectric structure and the third epitaxial region, the conductor via narrower at an end of the conductor via that contacts the first epitaxial region than at an opposite end.Type: ApplicationFiled: January 9, 2024Publication date: May 2, 2024Inventors: Ehren MANNEBACH, Aaron LILAK, Hui Jae YOO, Patrick MORROW, Anh PHAN, Willy RACHMADY, Cheng-Ying HUANG, Gilbert DEWEY
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Publication number: 20240136277Abstract: A device includes a device level having a metallization structure coupled to a semiconductor device and a transistor above the device level. The transistor has a body including a single crystal group III-V or group IV semiconductor material, a source structure on a first portion of the body and a drain structure on a second portion of the body, where the source structure is separate from the drain structure. The transistor further includes a gate structure including a first gate structure portion in a recess in the body and a second gate structure portion between the source structure and the drain structure. A source contact is coupled with the source structure and a drain contact is coupled with the drain structure. The source contact is in contact with the metallization structure in the device level.Type: ApplicationFiled: December 22, 2023Publication date: April 25, 2024Applicant: Intel CorporationInventors: Gilbert Dewey, Ryan Keech, Cory Bomberger, Cheng-Ying Huang, Ashish Agrawal, Willy Rachmady, Anand Murthy
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Publication number: 20240120317Abstract: A fan-out semiconductor device includes stacked semiconductor dies having die bond pads arranged in columns exposed at a sidewall of the stacked semiconductor dies. The stacked dies are encapsulated in a photo imageable dielectric (PID) material, which is developed to form through-hole cavities that expose the columns of bond pads of each die at the sidewall. The through-hole cavities are plated or filled with an electrical conductor to form conductive through-holes coupling die bond pads within the columns to each other.Type: ApplicationFiled: July 13, 2023Publication date: April 11, 2024Applicant: Western Digital Technologies, Inc.Inventors: Cheng-Hsiung Yang, Chien Te Chen, Cong Zhang, Ching-Chuan Hsieh, Yu-Ying Tan, Juan Zhou, Ai-wen Wang, Yih-Fran Lee, Yu-Wen Huang
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Publication number: 20240113161Abstract: A transistor includes a body of semiconductor material, where the body has laterally opposed body sidewalls and a top surface. A gate structure contacts the top surface of the body. A source region contacts a first one of the laterally opposed body sidewalls and a drain region contacts a second one of the laterally opposed body sidewalls. A first isolation region is under the source region and has a top surface in contact with a bottom surface of the source region. A second isolation region is under the drain region and has a top surface in contact with a bottom surface of the drain region. Depending on the transistor configuration, a major portion of the inner-facing sidewalls of the first and second isolation regions contact respective sidewalls of either a subfin structure (e.g., FinFET transistor configurations) or a lower portion of a gate structure (e.g., gate-all-around transistor configuration).Type: ApplicationFiled: December 14, 2023Publication date: April 4, 2024Inventors: Willy RACHMADY, Cheng-Ying HUANG, Matthew V. METZ, Nicholas G. MINUTILLO, Sean T. MA, Anand S. MURTHY, Jack T. KAVALIEROS, Tahir GHANI, Gilbert DEWEY
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Patent number: 11942416Abstract: Embodiments disclosed herein include electronic systems with vias that include a horizontal and vertical portion in order to provide interconnects to stacked components, and methods of forming such systems. In an embodiment, an electronic system comprises a board, a package substrate electrically coupled to the board, and a die electrically coupled to the package substrate. In an embodiment the die comprises a stack of components, and a via adjacent to the stack of components, wherein the via comprises a vertical portion and a horizontal portion.Type: GrantFiled: June 28, 2019Date of Patent: March 26, 2024Assignee: Intel CorporationInventors: Ehren Mannebach, Aaron Lilak, Hui Jae Yoo, Patrick Morrow, Anh Phan, Willy Rachmady, Cheng-Ying Huang, Gilbert Dewey, Rishabh Mehandru
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Publication number: 20240096998Abstract: The present disclosure describes a method for forming metallization layers that include a ruthenium metal liner and a cobalt metal fill. The method includes depositing a first dielectric on a substrate having a gate structure and source/drain (S/D) structures, forming an opening in the first dielectric to expose the S/D structures, and depositing a ruthenium metal on bottom and sidewall surfaces of the opening. The method further includes depositing a cobalt metal on the ruthenium metal to fill the opening, reflowing the cobalt metal, and planarizing the cobalt and ruthenium metals to form S/D conductive structures with a top surface coplanar with a top surface of the first dielectric.Type: ApplicationFiled: November 21, 2023Publication date: March 21, 2024Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Shuen-Shin LIANG, Chij-chien CHI, Yi-Ying LIU, Chia-Hung CHU, Hsu-Kai CHANG, Cheng-Wei CHANG, Chein-Shun LIAO, Keng-chu LIN, KAi-Ting HUANG
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Patent number: 11935891Abstract: Multiple non-silicon semiconductor material layers may be stacked within a fin structure. The multiple non-silicon semiconductor material layers may include one or more layers that are suitable for P-type transistors. The multiple non-silicon semiconductor material layers may further include one or more one or more layers that are suited for N-type transistors. The multiple non-silicon semiconductor material layers may further include one or more intervening layers separating the N-type from the P-type layers. The intervening layers may be at least partially sacrificial, for example to allow one or more of a gate, source, or drain to wrap completely around a channel region of one or more of the N-type and P-type transistors.Type: GrantFiled: June 13, 2022Date of Patent: March 19, 2024Assignee: Intel CorporationInventors: Gilbert Dewey, Patrick Morrow, Ravi Pillarisetty, Rishabh Mehandru, Cheng-ying Huang, Willy Rachmady, Aaron Lilak
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Publication number: 20240088153Abstract: Gate-all-around integrated circuit structures having depopulated channel structures, and methods of fabricating gate-all-around integrated circuit structures having depopulated channel structures using a selective bottom-up approach, are described. For example, an integrated circuit structure includes a vertical arrangement of nanowires above a substrate. The vertical arrangement of nanowires has one or more active nanowires above one or more oxide nanowires. A first gate stack is over and around the one or more active nanowires. A second gate stack is over and around the one or more oxide nanowires.Type: ApplicationFiled: November 17, 2023Publication date: March 14, 2024Inventors: Nicole THOMAS, Ehren MANNEBACH, Cheng-Ying HUANG, Marko RADOSAVLJEVIC
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Patent number: 11929435Abstract: Techniques are disclosed for an integrated circuit including a ferroelectric gate stack including a ferroelectric layer, an interfacial oxide layer, and a gate electrode. The ferroelectric layer can be voltage activated to switch between two ferroelectric states. Employing such a ferroelectric layer provides a reduction in leakage current in an off-state and provides an increase in charge in an on-state. The interfacial oxide layer can be formed between the ferroelectric layer and the gate electrode. Alternatively, the ferroelectric layer can be formed between the interfacial oxide layer and the gate electrode.Type: GrantFiled: August 30, 2022Date of Patent: March 12, 2024Assignee: Intel CorporationInventors: Gilbert Dewey, Willy Rachmady, Jack T. Kavalieros, Cheng-Ying Huang, Matthew V. Metz, Sean T. Ma, Harold Kennel, Tahir Ghani
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Patent number: 11929320Abstract: A device includes a device level having a metallization structure coupled to a semiconductor device and a transistor above the device level. The transistor has a body including a single crystal group III-V or group IV semiconductor material, a source structure on a first portion of the body and a drain structure on a second portion of the body, where the source structure is separate from the drain structure. The transistor further includes a gate structure including a first gate structure portion in a recess in the body and a second gate structure portion between the source structure and the drain structure. A source contact is coupled with the source structure and a drain contact is coupled with the drain structure. The source contact is in contact with the metallization structure in the device level.Type: GrantFiled: March 30, 2022Date of Patent: March 12, 2024Assignee: Intel CorporationInventors: Gilbert Dewey, Ryan Keech, Cory Bomberger, Cheng-Ying Huang, Ashish Agrawal, Willy Rachmady, Anand Murthy
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Patent number: 11923370Abstract: Embodiments disclosed herein include forksheet transistor devices having a dielectric or a conductive spine. For example, an integrated circuit structure includes a dielectric spine. A first transistor device includes a first vertical stack of semiconductor channels spaced apart from a first edge of the dielectric spine. A second transistor device includes a second vertical stack of semiconductor channels spaced apart from a second edge of the dielectric spine. An N-type gate structure is on the first vertical stack of semiconductor channels, a portion of the N-type gate structure laterally between and in contact with the first edge of the dielectric spine and the first vertical stack of semiconductor channels. A P-type gate structure is on the second vertical stack of semiconductor channels, a portion of the P-type gate structure laterally between and in contact with the second edge of the dielectric spine and the second vertical stack of semiconductor channels.Type: GrantFiled: September 23, 2020Date of Patent: March 5, 2024Assignee: Intel CorporationInventors: Seung Hoon Sung, Cheng-Ying Huang, Marko Radosavljevic, Christopher M. Neumann, Susmita Ghose, Varun Mishra, Cory Weber, Stephen M. Cea, Tahir Ghani, Jack T. Kavalieros
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Patent number: 11923410Abstract: A transistor includes a body of semiconductor material, where the body has laterally opposed body sidewalls and a top surface. A gate structure contacts the top surface of the body. A source region contacts a first one of the laterally opposed body sidewalls and a drain region contacts a second one of the laterally opposed body sidewalls. A first isolation region is under the source region and has a top surface in contact with a bottom surface of the source region. A second isolation region is under the drain region and has a top surface in contact with a bottom surface of the drain region. Depending on the transistor configuration, a major portion of the inner-facing sidewalls of the first and second isolation regions contact respective sidewalls of either a subfin structure (e.g., FinFET transistor configurations) or a lower portion of a gate structure (e.g., gate-all-around transistor configuration).Type: GrantFiled: October 4, 2021Date of Patent: March 5, 2024Assignee: Intel CorporationInventors: Willy Rachmady, Cheng-Ying Huang, Matthew V. Metz, Nicholas G. Minutillo, Sean T. Ma, Anand S. Murthy, Jack T. Kavalieros, Tahir Ghani, Gilbert Dewey
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Patent number: 11916118Abstract: A device is disclosed. The device includes a first epitaxial region, a second epitaxial region, a first gate region between the first epitaxial region and a second epitaxial region, a first dielectric structure underneath the first epitaxial region, a second dielectric structure underneath the second epitaxial region, a third epitaxial region underneath the first epitaxial region, a fourth epitaxial region underneath the second epitaxial region, and a second gate region between the third epitaxial region and a fourth epitaxial region and below the first gate region. The device also includes, a conductor via extending from the first epitaxial region, through the first dielectric structure and the third epitaxial region, the conductor via narrower at an end of the conductor via that contacts the first epitaxial region than at an opposite end.Type: GrantFiled: April 4, 2023Date of Patent: February 27, 2024Assignee: Intel CorporationInventors: Ehren Mannebach, Aaron Lilak, Hui Jae Yoo, Patrick Morrow, Anh Phan, Willy Rachmady, Cheng-Ying Huang, Gilbert Dewey
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Publication number: 20240047559Abstract: Gate-all-around integrated circuit structures having depopulated channel structures, and methods of fabricating gate-all-around integrated circuit structures having depopulated channel structures using a bottom-up oxidation approach, are described. For example, an integrated circuit structure includes a vertical arrangement of nanowires above a substrate. The vertical arrangement of nanowires has one or more active nanowires above one or more oxidized nanowires. A gate stack is over the vertical arrangement of nanowires and around the one or more oxidized nanowires.Type: ApplicationFiled: October 19, 2023Publication date: February 8, 2024Inventors: Willy RACHMADY, Gilbert DEWEY, Jack T. KAVALIEROS, Aaron LILAK, Patrick MORROW, Anh PHAN, Cheng-Ying HUANG, Ehren MANNEBACH
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Patent number: 11894372Abstract: A device is disclosed. The device includes a first semiconductor fin, a first source-drain epitaxial region adjacent a first portion of the first semiconductor fin, a second source-drain epitaxial region adjacent a second portion of the first semiconductor fin, a first gate conductor above the first semiconductor fin, a gate spacer covering the sides of the gate conductor, a second semiconductor fin below the first semiconductor fin, a second gate conductor on a first side of the second semiconductor fin and a third gate conductor on a second side of the second semiconductor fin, a third source-drain epitaxial region adjacent a first portion of the second semiconductor fin, and a fourth source-drain epitaxial region adjacent a second portion of the second semiconductor fin. The device also includes a dielectric isolation structure below the first semiconductor fin and above the second semiconductor fin that separates the first semiconductor fin and the second semiconductor fin.Type: GrantFiled: January 11, 2023Date of Patent: February 6, 2024Assignee: Intel CorporationInventors: Willy Rachmady, Cheng-Ying Huang, Gilbert Dewey, Aaron Lilak, Patrick Morrow, Anh Phan, Ehren Mannebach, Jack T. Kavalieros
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Patent number: 11887988Abstract: Thin film transistor structures may include a regrown source or drain material between a channel material and source or drain contact metallization. The source or drain material may be selectively deposited at low temperatures to backfill recesses formed in the channel material. Electrically active dopant impurities may be introduced in-situ during deposition of the source or drain material. The source or drain material may overlap a portion of a gate electrode undercut by the recesses. With channel material of a first composition and source or drain material of a second composition, thin film transistor structures may display low external resistance and high channel mobility.Type: GrantFiled: August 1, 2019Date of Patent: January 30, 2024Assignee: Intel CorporationInventors: Ashish Agrawal, Jack Kavalieros, Anand Murthy, Gilbert Dewey, Matthew Metz, Willy Rachmady, Cheng-Ying Huang, Cory Bomberger
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Publication number: 20240006499Abstract: An integrated circuit includes an upper semiconductor body extending in a first direction from an upper source region to an upper drain region, and a lower semiconductor body extending in the first direction from a lower source region to a lower drain region. The upper body is spaced vertically from the lower body in a second direction orthogonal to the first direction. A gate spacer structure is adjacent to the upper and lower source regions. In an example, the gate spacer structure includes (i) a first section having a first dimension in the first direction, and (ii) a second section having a second dimension in the first direction. In an example, the first dimension is different from the second dimension by at least 1 nm. In some cases, an intermediate portion of the gate spacer structure extends laterally within a given gate structure, or between upper and lower gate structures.Type: ApplicationFiled: June 30, 2022Publication date: January 4, 2024Applicant: Intel CorporationInventors: Cheng-Ying Huang, Kai Loon Cheong, Pooja Nath, Susmita Ghose, Rambert Nahm, Natalie Briggs, Charles C. Kuo, Nicole K. Thomas, Munzarin F. Qayyum, Marko Radosavljevic, Jack T. Kavalieros, Thoe Michaelos, David Kohen
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Patent number: 11862715Abstract: Tunneling Field Effect Transistors (TFETs) are promising devices in that they promise significant performance increase and energy consumption decrease due to a steeper subthreshold slope (for example, smaller sub-threshold swing). In various embodiments, vertical fin-based TFETs can be fabricated in trenches, for example, silicon trenches. In another embodiment, vertical TFETs can be used on different material systems acting as a substrate and/or trenches (for example, Si, Ge, III-V semiconductors, GaN, and the like). In one embodiment, the tunneling direction in the channel of the vertical TFET can be perpendicular to the Si substrates. In one embodiment, this can be different than the tunneling direction in the channel of lateral TFETs.Type: GrantFiled: May 16, 2022Date of Patent: January 2, 2024Assignee: Intel CorporationInventors: Cheng-Ying Huang, Jack Kavalieros, Ian Young, Matthew Metz, Willy Rachmady, Uygar Avci, Ashish Agrawal, Benjamin Chu-Kung
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Patent number: 11862636Abstract: Gate-all-around integrated circuit structures having depopulated channel structures, and methods of fabricating gate-all-around integrated circuit structures having depopulated channel structures using a selective bottom-up approach, are described. For example, an integrated circuit structure includes a vertical arrangement of nanowires above a substrate. The vertical arrangement of nanowires has one or more active nanowires above one or more oxide nanowires. A first gate stack is over and around the one or more active nanowires. A second gate stack is over and around the one or more oxide nanowires.Type: GrantFiled: April 27, 2022Date of Patent: January 2, 2024Assignee: Intel CorporationInventors: Nicole Thomas, Ehren Mannebach, Cheng-Ying Huang, Marko Radosavljevic
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Publication number: 20230420460Abstract: An integrated circuit structure includes a device layer including an upper device above a lower device. The upper device includes an upper source or drain region, and an upper source or drain contact coupled to the upper source or drain region. The lower device includes a lower source or drain region. A first conductive feature is below the device layer, where the first conductive feature is coupled to the lower source or drain region. A second conductive feature vertically extends through the device layer. In an example, the second conductive feature is to couple (i) the first conductive feature below the device layer and (ii) an interconnect structure above the device layer. Thus, the first and second conductive features facilitate a connection between the interconnect structure on the frontside of the integrated circuit and the lower source or drain region towards the backside of the integrated circuit.Type: ApplicationFiled: June 23, 2022Publication date: December 28, 2023Applicant: Intel CorporationInventors: Cheng-Ying Huang, Patrick Morrow, Quan Shi, Rohit Galatage, Nicole K. Thomas, Munzarin F. Qayyum, Jami A. Wiedemer, Gilbert Dewey, Mauro J. Kobrinsky, Marko Radosavljevic, Jack T. Kavalieros