Patents by Inventor Chenggang Xu

Chenggang Xu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240101683
    Abstract: An anti-FGFR2 antibody, an encoding nucleic acid of the antibody, a vector and host cell for the expression and production thereof, an antibody-drug conjugate, and a pharmaceutical composition comprising the antibody. The present invention further relates to the use of the antibody molecule in a drug for diagnosing a cancer caused by FGFR2-pathway-related dysregulation, and the use of the antibody or antibody-drug conjugate in the preparation of a medicament for treating a cancer caused by FGFR2-pathway-related dysregulation, in particular gastric cancer.
    Type: Application
    Filed: December 29, 2021
    Publication date: March 28, 2024
    Inventors: Chenggang Zhu, Liangliang Xu, Jiexian Dong, Chaochun Zhang, Xuan Yang, Fangli Peng, Yeqing Li, Chaole Chen, Liming Bao, Xiangyan Min
  • Patent number: 8640062
    Abstract: A mechanism is provided for rapid estimation of temperature rise in wires due to Joule heating. The mechanism provides fast and accurate estimation of temperature rise in wires due to self heating. Fast estimation is important to handle millions of nets at the full-chip level. The mechanism models lateral heat flow by considering longitudinal heat flow along the wire and lateral thermal coupling to the other wires in the same level. Lateral heat flow can have a significant effect on the temperature rise. The mechanism also models vertical heat flow to the substrate and the heat sink by considering thermal conductivities of vias and inter-layer dielectric (ILD). The mechanism efficiently solves the thermal system to enable physical design optimizations (e.g., wire sizing, etc.) for fixing electromigration violations.
    Type: Grant
    Filed: June 10, 2011
    Date of Patent: January 28, 2014
    Assignee: International Business Machines Corporation
    Inventors: Kanak B. Agarwal, Sani R. Nassif, Ronald D. Rose, Chenggang Xu
  • Publication number: 20120317529
    Abstract: A mechanism is provided for rapid estimation of temperature rise in wires due to Joule heating. The mechanism provides fast and accurate estimation of temperature rise in wires due to self heating. Fast estimation is important to handle millions of nets at the full-chip level. The mechanism models lateral heat flow by considering longitudinal heat flow along the wire and lateral thermal coupling to the other wires in the same level. Lateral heat flow can have a significant effect on the temperature rise. The mechanism also models vertical heat flow to the substrate and the heat sink by considering thermal conductivities of vias and inter-layer dielectric (ILD). The mechanism efficiently solves the thermal system to enable physical design optimizations (e.g., wire sizing, etc.) for fixing electromigration violations.
    Type: Application
    Filed: June 10, 2011
    Publication date: December 13, 2012
    Applicant: International Business Machines Corporation
    Inventors: Kanak B. Agarwal, Sani R. Nassif, Ronald D. Rose, Chenggang Xu