Patents by Inventor Cheng-Long Wu

Cheng-Long Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for detecting a semiconductor manufacturing defect
    Publication number: 20060064262
    Abstract: A method of semiconductor device defect analysis is provided. The method includes performing, by a first entity, a first defect analysis of a potential defect in a semiconductor device. The method also includes storing the first defect analysis in a potential defect database. The method further includes performing, by a second entity, a second defect analysis of the potential defect. The method still further includes determining if the first defect analysis is consistent with the second defect analysis.
    Type: Application
    Filed: September 20, 2004
    Publication date: March 23, 2006
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Ju-Ching Chang, Pei Chao, Shuenn Her Lee, Cheng-Long Wu