Abstract: A testing device includes a system circuit board, a first chip component, a supporting structure, a circuit board and an interposer. The system circuit board has a surface where the first chip component is disposed. The first chip component is connected to the system circuit board. The supporting structure is disposed on the surface and surrounds the first chip component; the circuit board is fixed on the supporting structure and keeps distance from the first chip component. The circuit board has a connector for connecting to a chip component that is to be tested. The interposer is located between the circuit board and the first chip component. The circuit board is connected to the first chip component via the interposer. The first chip component need not connect to the chip component to be tested, so is less liable to be damaged by the frequent testing.

Abstract: A connector and an electronic device for connecting an electronic component and a testing apparatus are provided. The connector includes a substrate and a plurality of conductive resilient sheets. The substrate includes a surface and a plurality of recesses disposed on the surface. Each of the conductive resilient sheets is disposed on the surface and has an end portion sunk in the recess. And the electronic device includes the aforesaid connector and an electronic component, which is disposed on the connector and has a plurality of bumps disposed on a surface of the electronic component. The bumps touch the end portions of the conductive resilient sheets and partially sunk in the recesses. Therefore, the touching connection between the electronic component and the conductive resilient sheets can be more stable.

Abstract: A testing device is disclosed, including a system circuit board, a first chip component, a supporting structure, a circuit board and an interposer. The system circuit board has a surface where the first chip component is disposed. The first chip component is connected to the system circuit board. The supporting structure is disposed on the surface and surrounds the first chip component; the circuit board is fixed on the supporting structure and keeps distance from the first chip component. The circuit board has a connector for connecting to a chip component that is to be tested. The interposer is located between the circuit board and the first chip component. The circuit board is connected to the first chip component via the interposer. The first chip component need not connect to the chip component to be tested, so is less liable to be damaged by the frequent testing.

Abstract: A connector and an electronic device for connecting an electronic component and a testing apparatus are provided. The connector includes a substrate and a plurality of conductive resilient sheets. The substrate includes a surface and a plurality of recesses disposed on the surface. Each of the conductive resilient sheets is disposed on the surface and has an end portion sunk in the recess. And the electronic device includes the aforesaid connector and an electronic component, which is disposed on the connector and has a plurality of bumps disposed on a surface of the electronic component. The bumps touch the end portions of the conductive resilient sheets and partially sunk in the recesses. Therefore, the touching connection between the electronic component and the conductive resilient sheets can be more stable.