Abstract: The present application provides a backlight module and a liquid crystal display device; the first portion of the slit adhesive is formed with a notch, so that when internal stress generates in the slit adhesive due to environmental changes, the internal stress can be released through the notch, thereby preventing the slit adhesive from warping and improving the yield of the backlight module.

Abstract: A storage device includes 3D NAND including layers of multi-level cells. When a shutdown command is received, whether a block is partially written is evaluated. If so, dummy lines are written after the last written wordline of the block. Partially written blocks may be those having a fill percentage less than a threshold. The threshold may be a function of the PEC count of the block. If a maximum retention time is exceeded by data stored in a partially written block, dummy lines may also be written to the block.

Abstract: A storage device includes 3D NAND including layers of multi-level cells. When a shutdown command is received, whether a block is partially written is evaluated. If so, dummy lines are written after the last written wordline of the block. Partially written blocks may be those having a fill percentage less than a threshold. The threshold may be a function of the PEC count of the block. If a maximum retention time is exceeded by data stored in a partially written block, dummy lines may also be written to the block.

Abstract: This application provides a power supply system for a terminal device, and a chip, and relates to the charging field. The power supply system includes a battery pack, a bypass circuit, a voltage step-down circuit, and a controller. The battery pack includes at least two batteries. The controller is configured to: when the batteries in the battery pack need to be switched to a series mode, control the voltage step-down circuit to work and control the bypass circuit to stop working, and is further configured to: when the batteries in the battery pack need to be switched to a parallel mode, control the bypass circuit to work and control the voltage step-down circuit to stop working. In the system, switching between the series mode and the parallel mode can be automatically implemented based on an actual situation, so that endurance and stability of the terminal device are improved.