Patents by Inventor Chester L. Shepard
Chester L. Shepard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6938488Abstract: An ultrasound inspection apparatus particularly adapted to examine containers (sealed or unsealed) containing a liquid or solid bulk material. The apparatus has an overall configuration of a hand held pistol with a front transducer contact surface that is positioned against a front wall of the container. An ultrasound pulse is transmitted from the apparatus to be reflected from a back wall of a container being investigated. The received echo pulse is converted to a digital waveform. The waveform is analyzed relative to temperature, travel distance of the pulse(s), and time of travel to ascertain characteristics of the liquid or other materials and to provide identification of the same.Type: GrantFiled: August 21, 2002Date of Patent: September 6, 2005Assignee: Battelle Memorial InstituteInventors: Aaron A. Diaz, Brion J. Burghard, James R. Skorpik, Richard A. Pappas, O. Dennis Mullen, Todd J. Samuel, Larry D. Reid, Joe C. Harris, Juan D. Valencia, Jonathan T. Smalley, Chester L. Shepard, Theodore T. Taylor
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Patent number: 6859517Abstract: Disclosed are an X-ray fluorescence (SRF) spectrometer and method for on-site and in-line determination of contaminant elements in lubricating oils and in fuel oils on board a marine vessel. An XRF source block 13 contains two radionuclide sources 16, 17 (e.g. Cd 109 and Fe 55), each oriented 180 degrees from the other to excite separate targets. The Cd 109 source 16 excites sample lube oil flowing through a low molecular weight sample line 18. The Fe 55 source 17 excites fuel oil manually presented to the source beam inside a low molecular weight vial 26 or other container. Two separate detectors A and B are arranged to detect the fluorescent x-rays from the targets, photons from the analyte atoms in the lube oil for example, and sulfur identifying x-rays from bunker fuel oil for example. The system allows both automated in-line and manual on-site analysis using one set of signal processing and multi-channel analyzer electronics 34, 37 as well as one computer 39 and user interface 43.Type: GrantFiled: April 22, 2003Date of Patent: February 22, 2005Assignee: Battelle Memorial InstituteInventors: Bary W. Wilson, Chester L. Shepard
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Patent number: 6810718Abstract: The present invention is an apparatus and method for analyzing a fluid used in a machine or in an industrial process line. The apparatus has at least one meter placed proximate the machine or process line and in contact with the machine or process fluid for measuring at least one parameter related to the fluid. The at least one parameter is a standard laboratory analysis parameter. The at least one meter includes but is not limited to viscometer, element meter, optical meter, particulate meter, and combinations thereof.Type: GrantFiled: January 10, 2003Date of Patent: November 2, 2004Assignee: Battelle Memorial InstituteInventors: Bary W. Wilson, Timothy J. Peters, Chester L. Shepard, James H. Reeves
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Publication number: 20040213373Abstract: Disclosed are an X-ray fluorescence (SRF) spectrometer and method for on-site and in-line determination of contaminant elements in lubricating oils and in fuel oils on board a marine vessel. An XRF source block 13 contains two radionuclide sources 16, 17 (e.g. Cd 109 and Fe 55), each oriented 180 degrees from the other to excite separate targets. The Cd 109 source 16 excites sample lube oil flowing through a low molecular weight sample line 18. The Fe 55 source 17 excites fuel oil manually presented to the source beam inside a low molecular weight vial 26 or other container. Two separate detectors A and B are arranged to detect the fluorescent x-rays from the targets, photons from the analyte atoms in the lube oil for example, and sulfur identifying x-rays from bunker fuel oil for example. The system allows both automated in-line and manual on-site analysis using one set of signal processing and multi-channel analyzer electronics 34, 37 as well as one computer 39 and user interface 43.Type: ApplicationFiled: April 22, 2003Publication date: October 28, 2004Inventors: Bary W. Wilson, Chester L. Shepard
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Patent number: 6796144Abstract: Techniques for measuring the temperature at various locations through the thickness of glass products and to control the glass processing operation with the sensed temperature information are disclosed. Fluorescence emission of iron or cerium in glass is excited and imaged onto segmented detectors. Spatially resolved temperature data are obtained through correlation of the detected photoluminescence signal with location within the glass. In one form the detected photoluminescence is compared to detected scattered excitation light to determine temperature. Stress information is obtained from the time history of the temperature profile data and used to evaluate the quality of processed glass. A heating or cooling rate of the glass is also controlled to maintain a predetermined desired temperature profile in the glass.Type: GrantFiled: May 30, 2001Date of Patent: September 28, 2004Assignee: Battelle Memorial InstituteInventors: Chester L. Shepard, Bret D. Cannon, Mohammad A. Khaleel
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Publication number: 20040035208Abstract: An ultrasound inspection apparatus particularly adapted to examine containers (sealed or unsealed) containing a liquid or solid bulk material. The apparatus has an overall configuration of a hand held pistol with a front transducer contact surface that is positioned against a front wall of the container. An ultrasound pulse is transmitted from the apparatus to be reflected from a back wall of a container being investigated. The received echo pulse is converted to a digital waveform. The waveform is analyzed relative to temperature, travel distance of the pulse(s), and time of travel to ascertain characteristics of the liquid or other materials and to provide identification of the same.Type: ApplicationFiled: August 21, 2002Publication date: February 26, 2004Inventors: Aaron A. Diaz, Brion J. Burghard, James R. Skorpik, Richard A. Pappas, O. Dennis Mullen, Todd J. Samuel, Larry D. Reid, Joe C. Harris, Juan D. Valencia, Jonathan T. Smalley, Chester L. Shepard, Theodore T. Taylor
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Patent number: 6668039Abstract: An X-ray fluorescence device and method are disclosed. The device includes a source block containing an X-ray source, a substantially X-ray transparent fluid flow path through the source block and proximate the X-ray source, and an X-ray detector separated from the X-ray source by the source block. First and second openings are provided in the source block between the X-ray source and the flow path and between the flow path and the detector respectively. In operation, source X-rays pass through the first opening and through the flow path. A portion of the source X-rays interact with a fluid in the flow path to create a fluid fluorescence response. The remainder of the source X-rays pass into a noise reduction cavity of the source block. The detector receives the portion of the fluid fluorescence response passing through the second opening and produces an output indicative of the presence and amount of selected components in the fluid.Type: GrantFiled: January 7, 2002Date of Patent: December 23, 2003Assignee: Battelle Memorial InstituteInventors: Chester L. Shepard, Bary W. Wilson, Leslie J. Kirihara, John T. Munley, James H. Reeves
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Publication number: 20030128805Abstract: An X-ray fluorescence device and method are disclosed. The device includes a source block containing an X-ray source, a substantially X-ray transparent fluid flow path through the source block and proximate the X-ray source, and an X-ray detector separated from the X-ray source by the source block. First and second openings are provided in the source block between the X-ray source and the flow path and between the flow path and the detector respectively. In operation, source X-rays pass through the first opening and through the flow path. A portion of the source X-rays interact with a fluid in the flow path to create a fluid fluorescence response. The remainder of the source X-rays pass into a noise reduction cavity of the source block. The detector receives the portion of the fluid fluorescence response passing through the second opening and produces an output indicative of the presence and amount of selected components in the fluid.Type: ApplicationFiled: January 7, 2002Publication date: July 10, 2003Inventors: Chester L. Shepard, Bary W. Wilson, Leslie J. Kirihara, John T. Munley, James H. Reeves
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Publication number: 20030101801Abstract: The present invention is an apparatus and method for analyzing a fluid used in a machine or in an industrial process line. The apparatus has at least one meter placed proximate the machine or process line and in contact with the machine or process fluid for measuring at least one parameter related to the fluid. The at least one parameter is a standard laboratory analysis parameter. The at least one meter includes but is not limited to viscometer, element meter, optical meter, particulate meter, and combinations thereof.Type: ApplicationFiled: January 10, 2003Publication date: June 5, 2003Inventors: Bary W. Wilson, Timothy J. Peters, Chester L. Shepard, James H. Reeves
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Patent number: 6561010Abstract: The present invention is an apparatus and method for analyzing a fluid used in a machine or in an industrial process line. The apparatus has at least one meter placed proximate the machine or process line and in contact with the machine or process fluid for measuring at least one parameter related to the fluid. The at least one parameter is a standard laboratory analysis parameter. The at least one meter includes but is not limited to viscometer, element meter, optical meter, particulate meter, and combinations thereof.Type: GrantFiled: February 1, 2001Date of Patent: May 13, 2003Assignee: Battelle Memorial InstituteInventors: Bary W. Wilson, Timothy J. Peters, Chester L. Shepard, James H. Reeves
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Publication number: 20030076487Abstract: A non-destructive and non-contact method for measuring stress at the mid-plane of tempered glass plates that uses Bragg scattering from a pair of thermal gratings. The gratings are formed by parallel writing beams of laser light retroreflected through the glass. The polarization state of light from a delayed laser beam that scatters from both these thermal gratings is measured, and the change in polarization of the doubly scattered light with separation between the two gratings is correlated to the in-plane stress. Systems and techniques to take these measurements and control a glass manufacturing process are also disclosed.Type: ApplicationFiled: August 3, 2001Publication date: April 24, 2003Inventors: Bret D. Cannon, Chester L. Shepard, Mohammad A. Khaleel
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Publication number: 20030024269Abstract: Techniques for measuring the temperature at various locations through the thickness of glass products and to control the glass processing operation with the sensed temperature information are disclosed. Fluorescence emission of iron or cerium in glass is excited and imaged onto segmented detectors. Spatially resolved temperature data are obtained through correlation of the detected photoluminescence signal with location within the glass. In one form the detected photoluminescence is compared to detected scattered excitation light to determine temperature. Stress information is obtained from the time history of the temperature profile data and used to evaluate the quality of processed glass. A heating or cooling rate of the glass is also controlled to maintain a predetermined desired temperature profile in the glass.Type: ApplicationFiled: May 30, 2001Publication date: February 6, 2003Inventors: Chester L. Shepard, Bret D. Cannon, Mohammad A. Khaleel
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Publication number: 20010013247Abstract: The present invention is an apparatus and method for analyzing a fluid used in a machine or in an industrial process line. The apparatus has at least one meter placed proximate the machine or process line and in contact with the machine or process fluid for measuring at least one parameter related to the fluid. The at least one parameter is a standard laboratory analysis parameter. The at least one meter includes but is not limited to viscometer, element meter, optical meter, particulate meter, and combinations thereof.Type: ApplicationFiled: February 1, 2001Publication date: August 16, 2001Inventors: Bary W. Wilson, Timothy J. Peters, Chester L. Shepard, James H. Reeves