Abstract: An in-circuit test probe apparatus for probing the finely and closely spaced leads of an LSI circuit package in order to monitor the signals on the pins. A magnetic holding assembly is utilized to attach the test probe apparatus to the circuit package which is positioned with a cavity in the bottom of the test probe apparatus. A layer of silicon rubber is positioned between rough and fine probe pin location members to hold the probes during test and to allow easy insertion and removal of the test probe.

Abstract: An arterial bypass tool for use in inserting and positioning a bypass artery alongside an occluded artery within the body of a patient includes an arcuate tubular sheath. A rod is slidably received through the sheath and terminates at a forward end in a tapering, radiused tip. A rearward end of the rod terminates in an enlarged tab dimensioned for passage through the sheath. A pair of apertures formed in the tab allow a bypass artery to be stitched thereto. In use, an entrance incision is formed in a patient adjacent one end of an occluded artery. The radiused tip is inserted through the entrance incision and the sheath and enclosed rod are passed alongside the occluded artery. An exit incision is then formed adjacent the radiused tip. The forward end of the sheath is then pushed through the exit incision. A bypass artery is secured to the tab at the opposite end of the rod, adjacent the entrance incision.