Abstract: A method for testing a function of an electronic apparatus is provided. The method includes steps of: searching for a location corresponding to the function to be tested, sending a command according to the location to perform the function to be tested, and determining whether an error occurs in the function according to a response from the function in response to the command.

Abstract: A brightness enhancement film includes a substrate, a plurality of light-gathering units, and a plurality of micro-lenses. The substrate includes a first surface and a second surface that is opposite the first surface. The light-gathering units are mounted on the first surface, with the light-gathering units being aligned and spaced from each other in a first direction to form columns of the light-gathering units and the columns being arranged in a second direction to form a matrix of the light-gathering units, with each of the light-gathering units including a top face and a plurality of stepped portions on a peripheral surface of the light-gathering unit between the top face and the first surface. And the micro-lenses mounted on the first surface, with each of the micro-lenses being located between two adjacent light-gathering units in the first direction and between another two adjacent light-gathering units in the second direction.