Abstract: An IC structure and a method of forming the same are provided. In an embodiment, an exemplary method of forming the IC structure forming a first semiconductor fin and a second semiconductor fin protruding from a substrate, forming a high-k metal gate (HKMG) structure over the first semiconductor fin and the second semiconductor fin, forming a trench to separate the HKMG structure into two portions, conformally depositing a first dielectric layer in the trench, depositing a second dielectric layer over the first dielectric layer to fill the trench, wherein the second dielectric layer includes nitrogen, and the first dielectric layer is free of nitrogen, and planarizing the first dielectric layer and second dielectric layer to form a gate isolation structure in the trench.

Abstract: A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.

Abstract: A method for forming a semiconductor structure is provided. The method for forming the semiconductor structure includes forming first fin structures and a second fin structures over a substrate, forming a first gate stack and a second gate stack that extend in a first direction across the first fin structures and the second fin structures, respectively, and etching the first gate stack and the second gate stack to form a first trench through the first gate stack and a second trench through the second gate stack. A first dimension of the first trench in the first direction is greater than a second dimension of the second trench in the first direction. The method further includes forming a first gate cutting structure and a second gate cutting structure in the first trench and the second trench, respectively.

Abstract: Described are system and methods for maximizing charging power to an information handling system (IHS) from a programmable power supply (PPS). The IHS and the PPS initiate communication with one another. Information is exchanged as to the capabilities of the PPS for providing charging power to battery cells of the IHS, and information as to the battery cells of the HIS. Charging power from the PPS based on the configuration and capability of the battery cells of the IHS, and charging power is kept at a maximum power throughout charging of the battery cells.

Abstract: Systems and methods that may be implemented to determine electrical characteristic/s of one or more power supply cable/s that are coupled to supply power from a power supply to a battery-powered information handling system, and to take one or more actions based on the determined electrical characteristic/s. The disclosed systems and methods may be so implemented to detect values of input voltage and input current that are provided from the power supply cable to a battery-powered information handling system, and to take one or more actions based on these detected values of input voltage and input current, such as power supply voltage compensation, protection of the power supply, alerts to the battery-powered information handling system, and/or warnings to a user of the battery-powered information handling system.

Abstract: A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; a power circuit providing a supply voltage to the target circuit under test, the supply voltage maintaining at a first voltage level in the first period and deviating from the first voltage level, and maintaining at the first voltage level in the second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.

Abstract: A method and system for supplying power at a voltage selected from a plurality of voltages. Power is initially received at a first voltage. Embodiments communicate with an AC adapter to get device identification and see if the AC adapter supports other voltages. If so, embodiments communicate with the AC adapter to get more information about the adapter and identify what voltages the adapter is capable of providing. If one of the voltages would allow an information handling system to operate more efficiently, embodiments negotiate a power supply contract to operate at a second voltage. When the information handling system powers down, the system resets to operation at the initial voltage.

Abstract: A high-performance single barrel power connector for receiving electric power may be capable of receiving more than 330 W up to approximately 600 W of power. The V+ pin and V? pin may each be configured with a large plurality of contact points for connecting to a power plug. A connector body retaining the V+ pin and V? pin may configured with openings to expose more of the V+ pin and V? pin to air and allow the V+ pin and V? pin to extend out of the power connector for convective and conductive heat transfer. A shell having a high thermal conductivity may be connected to the V? pin and V? pin and further connected to a bracket for increased heat transfer away from the V+ and V? pins.

Abstract: In one or more embodiments, one or more systems, one or more methods, and/or one or more processes may: send, by a battery management unit (BMU) of a battery of an information handling system (IHS), a request for a first amount of current to an embedded controller (EC) of the IHS; provide, by the EC, the request for the first amount of current to a charger of the IHS; receive, by the charger, the request; provide, by the charger, a second amount of current based at least on the request and based at least on a voltage measurement across a resistor of the charger; determine, by the BMU, a measurement of the second amount of current; provide, by the BMU, the measurement to the EC; determine, by the EC, that the measurement does not match the first amount of current; and provide, by the EC, an alert.

Abstract: A connector includes a receptacle and a plug. The receptacle includes a first terminal of a first gender. The plug includes a second terminal of a second gender opposite to the first gender. The plug further includes a cover and an insert. The cover plugs into the receptacle. The insert includes the second terminal. The insert inserts into the cover such that the first terminal makes an electrical connection with the second terminal.

Abstract: An apparatus for testing a device under test (DUT) is provided. The apparatus includes a power supply device and a data generating device. The power supply device is configured to provide a first voltage and a second voltage to the DUT. The data generating device is configured to provide first data to the DUT. The power supply device is configured to provide the first voltage to the DUT in a first time duration. The data generating device is configured to provide the first data to the DUT in the first time duration. The power supply device is configured to provide the second voltage to the DUT in a second time duration after the first time duration. The second voltage is different from the first voltage.

Abstract: The present disclosure provides embodiments of direct current (DC) power connectors and methods to manufacture the same. More specifically, the present disclosure provides a connector plug with improved power capacity and structural rigidity. The connector plug includes an inner body and an outer body coupled to transmit power through the DC power connector, wherein the inner body is concentrically arranged within the outer body, and an insulating barrel that is coupled between the inner body and the outer body to electrically isolate the inner body from the outer body. The inner body and outer body comprise a base metal or metal alloy having an electrical conductivity ranging between 30% International Annealed Copper Standard (IACS) and greater than or equal to 99% IACS.

Abstract: A high-performance single barrel power connector for receiving electric power may be capable of receiving more than 330 W up to approximately 600 W of power. The V+ pin and V? pin may each be configured with a large plurality of contact points for connecting to a power plug. A connector body retaining the V+ pin and V? pin may configured with openings to expose more of the V+ pin and V? pin to air and allow the V+ pin and V? pin to extend out of the power connector for convective and conductive heat transfer. A shell having a high thermal conductivity may be connected to the V? pin and V? pin and further connected to a bracket for increased heat transfer away from the V+ and V? pins.

Abstract: A method is provided and includes several operations: testing multiple scan chains in multiple shift cycles to obtain multiple values; determining at least one fail chain in the scan chains and determining at least one fail shift cycle corresponding to at least one fail value in the values; mapping the at least one fail chain and the at least one fail shift cycle to the scan chains to identify the at least one fail flip flop; and identifying at least one fault site corresponding to the at least one fail flip flop.

Abstract: An apparatus for testing a device under test (DUT) is provided. The apparatus includes a power supply device and a data generating device. The power supply device is configured to provide a first voltage and a second voltage to the DUT. The data generating device is configured to provide first data to the DUT. The power supply device is configured to provide the first voltage to the DUT in a first time duration. The data generating device is configured to provide the first data to the DUT in the first time duration. The power supply device is configured to provide the second voltage to the DUT in a second time duration after the first time duration. The second voltage is different from the first voltage.

Abstract: In one or more embodiments, one or more systems, one or more methods, and/or one or more processes may: send, by a battery management unit (BMU) of a battery of an information handling system (IHS), a request for a first amount of current to an embedded controller (EC) of the IHS; provide, by the EC, the request for the first amount of current to a charger of the IHS; receive, by the charger, the request; provide, by the charger, a second amount of current based at least on the request and based at least on a voltage measurement across a resistor of the charger; determine, by the BMU, a measurement of the second amount of current; provide, by the BMU, the measurement to the EC; determine, by the EC, that the measurement does not match the first amount of current; and provide, by the EC, an alert.

Abstract: Described are computer implemented methods, a system and a power supply amplifier (PSA) that supports compliance testing of the PSA. The power supplies power to a powered device/information handling system. A voltage of synchronous rectifier (SR) gate is measured and compared to a calculated sense voltage at a sense resistor of the PSA. If the sense voltage is zero, received current of the PSA bypasses a first blocking MOSFET and a second blocking MOSFET for over voltage protection. If the sense voltage is not zero, the received current passes through the first blocking MOSFET.

Abstract: In one embodiment, a method for managing a light source of a power adapter includes: determining that the power adapter is coupled to a power supply; causing the light source to be in a first illuminated state indicating that the power adapter is receiving the power from the power supply; determining that a first instance of a threshold period of inactivity has occurred; causing the light source to be in an unilluminated state; determining that the power adapter is communicably coupled to an information handling system; causing the light source to be in a second illuminated state indicating that the power adapter is providing the power to the information handling system; determining that a second instance of the threshold period of inactivity has occurred; and causing the light source to be in the unilluminated state.

Abstract: The present disclosure provides embodiments of direct current (DC) power connectors and methods to manufacture the same. More specifically, the present disclosure provides a connector plug with improved power capacity and structural rigidity. The connector plug includes an inner body and an outer body coupled to transmit power through the DC power connector, wherein the inner body is concentrically arranged within the outer body, and an insulating barrel that is coupled between the inner body and the outer body to electrically isolate the inner body from the outer body. The inner body and outer body comprise a base metal or metal alloy having an electrical conductivity ranging between 30% International Annealed Copper Standard (IACS) and greater than or equal to 99% IACS.

Abstract: In one embodiment, a method for managing a light source of a power adapter includes: determining that the power adapter is coupled to a power supply; causing the light source to be in a first illuminated state indicating that the power adapter is receiving the power from the power supply; determining that a first instance of a threshold period of inactivity has occurred; causing the light source to be in an unilluminated state; determining that the power adapter is communicably coupled to an information handling system; causing the light source to be in a second illuminated state indicating that the power adapter is providing the power to the information handling system; determining that a second instance of the threshold period of inactivity has occurred; and causing the light source to be in the unilluminated state.