Abstract: A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.

Abstract: A connection interface for a source device may include switching circuitry for causing the source device to deliver electrical energy to a sink device via an output of the source device when the source device and the sink device are electrically coupled via a connection, discharge circuitry for discharging an output voltage on the output when the connection is disconnected, and control circuitry for causing the switching circuitry to be activated and the discharge circuitry to be deactivated when the source device and the sink device are electrically coupled via the connection and causing the switching circuitry to be deactivated and the discharge circuitry to be activated when the connection is disconnected.

Abstract: A device for receiving power from a power supply and providing power to an information handling system including an embedded controller configured to monitor a load condition for the power supplied to the information handling system and regulate an output voltage of a power supply to maintain the output voltage supplied to the information handling system within a tolerance.

Abstract: Systems and methods that may be implemented to determine electrical characteristic/s of one or more power supply cable/s that are coupled to supply power from a power supply to a battery-powered information handling system, and to take one or more actions based on the determined electrical characteristic/s. The disclosed systems and methods may be so implemented to detect values of input voltage and input current that are provided from the power supply cable to a battery-powered information handling system, and to take one or more actions based on these detected values of input voltage and input current, such as power supply voltage compensation, protection of the power supply, alerts to the battery-powered information handling system, and/or warnings to a user of the battery-powered information handling system.

Abstract: A power adaptor provides power from a power source to a load device. The power adaptor includes a bulk capacitor and a controller. The controller detects a voltage level of input power from the power source, charges the bulk capacitor, detects a distortion of the voltage level in response to charging the bulk capacitor, and sets an output power limit for the power adaptor from a maximum output power limit for the power adaptor to a reduced output power limit in response to detecting the distortion.

Abstract: An information handling system includes first and second USB-C channels and a baseboard management controller (BMC). The first USB-C channel receives power from a first power adaptor, and the second USB-C channel receives power from a second power adaptor. The BMC determines an average current delivered to the information handling system from the first power adaptor and the second power adaptor, allocates a first portion of the average current to the first power adaptor and a second portion of the average current to the second power adaptor, and directs the first power adaptor to provide the first portion of the average current and the second power adaptor to provide the second portion of the average current.

Abstract: An apparatus for testing a device under test (DUT) is provided. The apparatus includes a power supply device and a data generating device. The power supply device is configured to provide a first voltage and a second voltage to the DUT. The data generating device is configured to provide first data to the DUT. The power supply device is configured to provide the first voltage to the DUT in a first time duration. The data generating device is configured to provide the first data to the DUT in the first time duration. The power supply device is configured to provide the second voltage to the DUT in a second time duration after the first time duration. The second voltage is different from the first voltage.

Abstract: A power adapter includes a flyback converter and a buck converter. If a first device is a preferred device, then power is allocated to the first device up to a first value. If a second device is plugged in, then power is re-allocating to the first device up to a second value and up to a third value to the second device. A total of the second value and the third value is up to the first value.

Abstract: An information handling system detects an initial insertion of an alternating current (AC) adapter, and determines an identifier associated with the AC adapter. The system may also determine a parameter for attenuating noise generated by the AC adapter based on the identifier, and attenuate the noise generated by the AC adapter by applying the parameter.

Abstract: An information handling system detects an initial insertion of an alternating current (AC) adapter, and determines an identifier associated with the AC adapter. The system may also determine a parameter for attenuating noise generated by the AC adapter based on the identifier, and attenuate the noise generated by the AC adapter by applying the parameter.

Abstract: A method is provided and includes several operations: testing multiple scan chains in multiple shift cycles to obtain multiple values; determining at least one fail chain in the scan chains and determining at least one fail shift cycle corresponding to at least one fail value in the values; mapping the at least one fail chain and the at least one fail shift cycle to the scan chains to identify the at least one fail flip flop; and identifying at least one fault site corresponding to the at least one fail flip flop.

Abstract: A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.

Abstract: Described are system and methods for maximizing charging power to an information handling system (IHS) from a programmable power supply (PPS). The IHS and the PPS initiate communication with one another. Information is exchanged as to the capabilities of the PPS for providing charging power to battery cells of the IHS, and information as to the battery cells of the HIS. Charging power from the PPS based on the configuration and capability of the battery cells of the IHS, and charging power is kept at a maximum power throughout charging of the battery cells.

Abstract: Systems and methods that may be implemented to determine electrical characteristic/s of one or more power supply cable/s that are coupled to supply power from a power supply to a battery-powered information handling system, and to take one or more actions based on the determined electrical characteristic/s. The disclosed systems and methods may be so implemented to detect values of input voltage and input current that are provided from the power supply cable to a battery-powered information handling system, and to take one or more actions based on these detected values of input voltage and input current, such as power supply voltage compensation, protection of the power supply, alerts to the battery-powered information handling system, and/or warnings to a user of the battery-powered information handling system.

Abstract: A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; a power circuit providing a supply voltage to the target circuit under test, the supply voltage maintaining at a first voltage level in the first period and deviating from the first voltage level, and maintaining at the first voltage level in the second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.

Abstract: A high-performance single barrel power connector for receiving electric power may be capable of receiving more than 330 W up to approximately 600 W of power. The V+ pin and V? pin may each be configured with a large plurality of contact points for connecting to a power plug. A connector body retaining the V+ pin and V? pin may configured with openings to expose more of the V+ pin and V? pin to air and allow the V+ pin and V? pin to extend out of the power connector for convective and conductive heat transfer. A shell having a high thermal conductivity may be connected to the V? pin and V? pin and further connected to a bracket for increased heat transfer away from the V+ and V? pins.

Abstract: A connector includes a receptacle and a plug. The receptacle includes a first terminal of a first gender. The plug includes a second terminal of a second gender opposite to the first gender. The plug further includes a cover and an insert. The cover plugs into the receptacle. The insert includes the second terminal. The insert inserts into the cover such that the first terminal makes an electrical connection with the second terminal.

Abstract: An apparatus for testing a device under test (DUT) is provided. The apparatus includes a power supply device and a data generating device. The power supply device is configured to provide a first voltage and a second voltage to the DUT. The data generating device is configured to provide first data to the DUT. The power supply device is configured to provide the first voltage to the DUT in a first time duration. The data generating device is configured to provide the first data to the DUT in the first time duration. The power supply device is configured to provide the second voltage to the DUT in a second time duration after the first time duration. The second voltage is different from the first voltage.

Abstract: A high-performance single barrel power connector for receiving electric power may be capable of receiving more than 330 W up to approximately 600 W of power. The V+ pin and V? pin may each be configured with a large plurality of contact points for connecting to a power plug. A connector body retaining the V+ pin and V? pin may configured with openings to expose more of the V+ pin and V? pin to air and allow the V+ pin and V? pin to extend out of the power connector for convective and conductive heat transfer. A shell having a high thermal conductivity may be connected to the V? pin and V? pin and further connected to a bracket for increased heat transfer away from the V+ and V? pins.

Abstract: A method is provided and includes several operations: testing multiple scan chains in multiple shift cycles to obtain multiple values; determining at least one fail chain in the scan chains and determining at least one fail shift cycle corresponding to at least one fail value in the values; mapping the at least one fail chain and the at least one fail shift cycle to the scan chains to identify the at least one fail flip flop; and identifying at least one fault site corresponding to the at least one fail flip flop.