Abstract: A memory includes a memory array and a single-ended sense amplifier circuit. The memory array includes wordlines, bitlines, and memory cells. The bitlines include a first bitline, routed on a first metal layer but not a second metal layer, and a second bitline, routed on the first metal layer and the second metal layer. Each of the memory cells is coupled to one of the wordlines. The memory cells include a first group of memory cells, coupled to the first bitline, and a second group of memory cells, coupled to the second bitline, where the first group of memory cells and the second group of memory cells are located at a same column. The single-ended sense amplifier circuit performs a read operation upon a target memory cell through single-ended sensing when a selected wordline is enabled.

Abstract: A pseudo multi-port memory includes a memory array, a row decoder circuit, a timing controller circuit, a sense amplifier circuit, and a write driver circuit. The timing controller circuit outputs a timing control signal to the row decoder circuit, wherein during one memory clock cycle, the row decoder circuit is controlled by the timing control signal to make a read wordline (RWL) signal have an enable pulse and a write wordline (WWL) signal have multiple enable pulses. During one memory clock cycle, the sense amplifier circuit performs read operations upon a selected memory cell when the selected RWL is enabled by the enable pulse and the selected WWL is enabled by at least one first enable pulse, and the write driver circuit performs a write operation upon the selected memory cell when the selected WWL is enabled by one second enable pulse.

Abstract: A pre-processing circuit is used for pre-processing a data-line voltage representative of a data output of a memory device. The pre-processing circuit includes a pre-charging circuit and a clamping circuit. The pre-charging circuit pre-charges a data line to adjust the data-line voltage at the data line that is coupled to the memory device. The clamping circuit clamps the data-line voltage to generate a clamped data-line voltage when the data-line voltage is pre-charged to a level that enables a clamping function of the clamping circuit, wherein the clamped data-line voltage is lower than a supply voltage of the pre-processing circuit. The clamping circuit includes a feedback circuit that feeds back a control voltage according to the data-line voltage at the data line, and further reduces its direct current (DC) leakage when the data-line voltage is clamped, wherein the clamping function of the clamping circuit is controlled by the control voltage.

Abstract: A pre-processing circuit is used for pre-processing a data-line voltage representative of a data output of a memory device. The pre-processing circuit includes a pre-charging circuit and a clamping circuit. The pre-charging circuit pre-charges a data line to adjust the data-line voltage at the data line that is coupled to the memory device. The clamping circuit clamps the data-line voltage to generate a clamped data-line voltage when the data-line voltage is pre-charged to a level that enables a clamping function of the clamping circuit, wherein the clamped data-line voltage is lower than a supply voltage of the pre-processing circuit. The clamping circuit includes a feedback circuit that feeds back a control voltage according to the data-line voltage at the data line, and further reduces its direct current (DC) leakage when the data-line voltage is clamped, wherein the clamping function of the clamping circuit is controlled by the control voltage.