Abstract: A semiconductor device includes a logic circuit region having at least one core device and at least one input/output (I/O) device. The at least one core device has a first accumulative antenna ratio, and the at least one I/O device has a second accumulative antenna ratio. The first accumulative antenna ratio is greater than the second accumulative antenna ratio.

Abstract: A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameters. The image processing device obtains the original image and the parameters, and drives the image processing hardware to perform a first image processing procedure to the original image based on the parameters to generate a hardware-processed image. The testing device obtains the original image, the parameters, and the hardware-processed image, and performs, through a simulation software, a second image processing procedure to the original image based on the parameters to generate a software-processed image. The testing device compares the hardware-processed image with the software-processed image through a testing software to generate a comparing result that shows a pixel difference of the hardware-processed image and the software-processed image.

Abstract: A method for creating a uniformity compensation look-up table is revealed. The method includes the following steps. First measure a plurality of areas on a plane users intend to make uniform to get a measured value of the respective area. Then get a central uniform estimate of a center of the plane. Also get a linear skeleton according to the position of one of the measured values and the position of the central uniform estimate. Next get a plurality of skeletal uniform estimates on the linear skeletons respectively by interpolation or extrapolation of the measured values, the central uniform estimate, and the distance between the position of the measured values and the center of the plane. At last get a plurality of planar uniform estimates on the plane in turn according to the skeletal uniform estimates of the two adjacent linear skeletons to establish the look-up table.