Patents by Inventor Chi Kwan Park

Chi Kwan Park has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11543362
    Abstract: A height of a vertical wire interconnection bonded onto a substrate is measured by first capturing a top view of the vertical wire interconnection and identifying a position of a tip end of the vertical wire interconnection from the top view. A conductive probe is located over the tip end of the vertical wire interconnection, and is lowered towards the vertical wire interconnection until an electrical connection is made between the conductive probe and the tip end of the vertical wire interconnection. A contact height at which the electrical connection is made may thus be determined, wherein the contact height corresponds to the height of the vertical wire interconnection.
    Type: Grant
    Filed: April 15, 2020
    Date of Patent: January 3, 2023
    Assignee: ASMPT SINGAPORE PTE. LTD.
    Inventors: Keng Yew Song, Chi Kwan Park, Jiang Huang, Ya Ping Zhu, Mow Huat Goh
  • Patent number: 11145620
    Abstract: A wire bonding method, comprising the steps of: extending a length of bonding wire from a capillary to form a wire tail; deforming a point on the wire tail to form a weakened portion between the wire tail and a remainder of the bonding wire retained within the capillary; and retracting at least a portion of the wire tail including the weakened portion into the capillary prior to bonding the wire tail to at least one of a bonding pad and a substrate.
    Type: Grant
    Filed: March 5, 2019
    Date of Patent: October 12, 2021
    Assignee: ASM TECHNOLOGY SINGAPORE PTE LTD
    Inventors: Mow Huat Goh, Jiang Huang, Ya Ping Zhu, Chi Kwan Park, Keng Yew Song
  • Publication number: 20200348243
    Abstract: A height of a vertical wire interconnection bonded onto a substrate is measured by first capturing a top view of the vertical wire interconnection and identifying a position of a tip end of the vertical wire interconnection from the top view. A conductive probe is located over the tip end of the vertical wire interconnection, and is lowered towards the vertical wire interconnection until an electrical connection is made between the conductive probe and the tip end of the vertical wire interconnection. A contact height at which the electrical connection is made may thus be determined, wherein the contact height corresponds to the height of the vertical wire interconnection.
    Type: Application
    Filed: April 15, 2020
    Publication date: November 5, 2020
    Inventors: Keng Yew SONG, Chi Kwan PARK, Jiang HUANG, Ya Ping ZHU, Mow Huat GOH
  • Publication number: 20200286855
    Abstract: A wire bonding method, comprising the steps of: extending a length of bonding wire from a capillary to form a wire tail; deforming a point on the wire tail to form a weakened portion between the wire tail and a remainder of the bonding wire retained within the capillary; and retracting at least a portion of the wire tail including the weakened portion into the capillary prior to bonding the wire tail to at least one of a bonding pad and a substrate.
    Type: Application
    Filed: March 5, 2019
    Publication date: September 10, 2020
    Inventors: Mow Huat GOH, Jiang HUANG, Ya Ping ZHU, Chi Kwan PARK, Keng Yew SONG
  • Patent number: 9881891
    Abstract: The invention provides a method of bonding wire between first and second bonding points with a bonding tool. It comprises the steps of forming a first bond at the first bonding point with the bonding tool, forming a first kink located over the first bond, and moving the bonding tool to a first position spaced from the first kink by a predetermined distance to release a length of wire from the bonding tool. It further comprises the step of moving the bonding tool in a direction away from the second bonding point to a second position which is outside a plane comprising the first bonding point, the second bonding point, and the first kink. It also comprises the steps of forming a second kink which lies outside the plane, and moving the bonding tool to the second bonding point to form a second bond.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: January 30, 2018
    Assignee: ASM TECHNOLOGY SINGAPORE PTE LTD
    Inventors: Jeffrey Grijaldo, Jung Min Kim, Joon Ho Lee, Chi Kwan Park, Keng Yew Song
  • Patent number: RE49923
    Abstract: A multilayer ceramic capacitor includes: a ceramic body including dielectric layers and first and second internal electrodes disposed to face each other with respective dielectric layers interposed therebetween; and first and second external electrodes disposed on an external surface of the ceramic body, wherein the dielectric layer contains a barium titanate-based powder particle having a core-shell structure including a core and a shell around the core, the shell having a structure in which titanium is partially substituted with an element having the same oxidation number as that of the titanium in the barium titanate-based powder particle and having an ionic radius different from that of the titanium in the barium titanate-based powder particle, and the shell covers at least 30% of a surface of the core.
    Type: Grant
    Filed: June 22, 2021
    Date of Patent: April 16, 2024
    Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
    Inventors: Jin Woo Kim, Jong Ho Lee, Min Gi Sin, Hak Kwan Kim, Chin Mo Kim, Chi Hwa Lee, Hong Seok Kim, Woo Sup Kim, Chang Hwa Park