Patents by Inventor Chi-Ming Yi

Chi-Ming Yi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130049787
    Abstract: The present invention provides a method of testing a stacked semiconductor device structure. This method includes the following steps: providing a testing board having a plurality of testing points and a probe card; providing a substrate which is disposed on the testing board; providing a plurality of semiconductor devices; mounting and electrically connecting a first one of the semiconductor devices onto the substrate; mounting and electrically connecting a second one of the semiconductor devices onto the first one of the semiconductor devices; keeping the probe card in contact with the second one of the semiconductor devices for electrical testing; and repeating the steps of mounting and testing of the semiconductor devices until all of the semiconductor devices are tested. This method can ensure the integrity of electrical interconnections between the semiconductor devices of the stacked structure.
    Type: Application
    Filed: April 12, 2012
    Publication date: February 28, 2013
    Inventors: Chi-Ming YI, An-Hong Liu, Hsiang-Ming Huang, Yi-Chang Lee
  • Patent number: 7864056
    Abstract: A depository monitoring system for use in a semiconductor factory comprises a plurality of carriers, each holding at least one semiconductor object; a depository monitoring host for monitoring a depository of each carrier; and a plurality of RFID tags and a plurality of RFID readers. It is characterized in that the RFID tags are disposed on the carriers and/or semiconductor objects, respectively, wherein each RFID tag has a tag information; the RFID readers read/write the tag information from/to the RFID tags; and the depository monitoring host comprises: a legacy database to store information related to the depository monitoring system; an RFID middleware for processing operations between the RFID readers and the RFID tags; a web interface for processing commands and query results through a B2B internet; an input/output interface for processing commands and query results through an intranet; and a depository controller for performing a sequence of processes in depository monitoring.
    Type: Grant
    Filed: April 19, 2008
    Date of Patent: January 4, 2011
    Assignee: Chipmos Technologies Inc
    Inventors: Wen-Hsiang Chiang, Tzu-Chung Fan, Shih-Ti Chi, Jui-Ching Huang, Shieng Chiang Fan, Chi-Ming Yi
  • Publication number: 20090224920
    Abstract: A depository monitoring system for use in a semiconductor factory comprises a plurality of carriers, each holding at least one semiconductor object; a depository monitoring host for monitoring a depository of each carrier; and a plurality of RFID tags and a plurality of RFID readers. It is characterized in that the RFID tags are disposed on the carriers and/or semiconductor objects, respectively, wherein each RFID tag has a tag information; the RFID readers read/write the tag information from/to the RFID tags; and the depository monitoring host comprises: a legacy database to store information related to the depository monitoring system; an RFID middleware for processing operations between the RFID readers and the RFID tags; a web interface for processing commands and query results through a B2B internet; an input/output interface for processing commands and query results through an intranet; and a depository controller for performing a sequence of processes in depository monitoring.
    Type: Application
    Filed: April 19, 2008
    Publication date: September 10, 2009
    Inventors: Wen-Hsiang CHIANG, Tzu-Chung Fan, Shih-Ti Chi, Jui - Ching Huang, Shieng Chiang Fan, Chi-Ming Yi