Patents by Inventor Chi-Yu Lu
Chi-Yu Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240362394Abstract: An integrated circuit structure includes a first and second power rail on a first level, a first and second set of conductive structures on a second level and a first, second and third conductive structure on a third level. The first set of conductive structures is over the first power rail. The second set of conductive structures is over the second power rail. The first conductive structure overlaps a first conductive structure of the first set of conductive structures and a first conductive structure of the second set of conductive structures. The second conductive structure overlaps a second conductive structure of the first set of conductive structures and a second conductive structure of the second set of conductive structures. The third conductive structure overlaps a third conductive structure of the first set of conductive structures and a third conductive structure of the second set of conductive structures.Type: ApplicationFiled: July 10, 2024Publication date: October 31, 2024Inventors: Jung-Chan YANG, Ting-Wei CHIANG, Cheng-I HUANG, Hui-Zhong ZHUANG, Chi-Yu LU, Stefan RUSU
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Publication number: 20240355707Abstract: An integrated circuit device includes a first-type active-region semiconductor structure extending and a second-type active-region semiconductor structure both extending in a first direction. The second-type active-region semiconductor structure is stacked with the first-type active-region semiconductor structure. The integrated circuit device also includes a front-side conductive layer above the two active-region semiconductor structures and a back-side conductive layer below the two active-region semiconductor structures. The integrated circuit device still includes a front-side power rail extending in the second direction in the front-side conductive layer and a back-side power rail extending in the second direction in the back-side conductive layer. The integrated circuit device further includes a first source conductive segment connected to the front-side power rail and a second source conductive segment connected to the back-side power rail.Type: ApplicationFiled: April 21, 2023Publication date: October 24, 2024Inventors: Yung-Chin HOU, Li-Chun TIEN, Chih-LIang CHEN, Chi-Yu LU, Wei-Cheng LIN, Guo-Huei WU
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Patent number: 12125792Abstract: A method of forming a semiconductor device, includes forming an active region; forming first, second and third metal-to-drain/source (MD) contact structures which extend in a first direction, and correspondingly overlap and electrically couple to the active region; forming a via-to-via (V2V) rail which extends in a second direction perpendicular to the first direction, overlaps at least the first MD contact structure and the third MD contact structures; forming a first via-to-MD (VD) structure over, and electrically coupled to, the first MD contact structure and the V2V rail; and forming a first conductive segment which overlaps the V2V rail, is in a first metallization layer, and is electrically coupled to the first VD structure.Type: GrantFiled: March 30, 2023Date of Patent: October 22, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jung-Chan Yang, Chi-Yu Lu, Hui-Zhong Zhuang, Chih-Liang Chen
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Publication number: 20240330564Abstract: A semiconductor device includes a plurality of active regions extending in a first direction. The semiconductor device further includes a gate electrode over the plurality of active regions, wherein the gate electrode extends in a second direction perpendicular to the first direction. The semiconductor device further includes a power rail extending in the first direction. The power rail includes a first power rail portion adjacent to the first boundary, wherein the first power rail portion has a first inner edge, and a second power rail portion adjacent to the second boundary, wherein the second power rail portion has a second inner edge, and the first inner edge is offset from the second inner edge in the second direction.Type: ApplicationFiled: June 12, 2024Publication date: October 3, 2024Inventors: Jung-Chan YANG, Hui-Zhong ZHUANG, Ting-Wei CHIANG, Chi-Yu LU
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Patent number: 12106033Abstract: The present disclosure describes a method for optimizing metal cuts in standard cells. The method includes placing a standard cell in a layout area and inserting a metal cut along a metal interconnect of the standard cell at a location away from a boundary of the standard cell. The method further includes disconnecting, at the location, a metal portion of the metal interconnect from a remaining portion of the metal interconnect based on the metal cut.Type: GrantFiled: June 26, 2023Date of Patent: October 1, 2024Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Cheok-Kei Lei, Zhe-Wei Jiang, Chi-Yu Lu, Yi-Hsin Ko, Chi-Lin Liu, Hui-Zhong Zhuang
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Publication number: 20240321870Abstract: A semiconductor device includes a substrate. The semiconductor device further includes a first gate structure on a first side of the substrate. The semiconductor device further includes a second gate structure on a second side of the substrate, wherein the first side is opposite the second side. The semiconductor device further includes a gate via extending through the substrate, wherein the gate via directly connects to the first gate structure, and the gate via directly connects to the second gate structure.Type: ApplicationFiled: June 5, 2024Publication date: September 26, 2024Inventors: Chih-Yu LAI, Chih-Liang CHEN, Chi-Yu LU, Shang-Syuan CIOU, Hui-Zhong ZHUANG, Ching-Wei TSAI, Shang-Wen CHANG
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Publication number: 20240296273Abstract: An integrated circuit includes a first power rail extending in a first direction, and configured to supply a first supply voltage, and a first region next to the first power rail. The first region includes a first conductive structure extending in the first direction, a first set of conductive structures extending in a second direction, and a first set of vias between the first set of conductive structures and the first conductive structure. The first set of conductive structures overlaps the first conductive structure and the first power rail, and is located on a second level. Each conductive structure of the first set of conductive structures is separated from each other in the first direction. Each via of the first set of vias is located where the first set of conductive structures overlaps the first conductive structure and couples the first set of conductive structures to the first conductive structure.Type: ApplicationFiled: May 14, 2024Publication date: September 5, 2024Inventors: Jung-Chan YANG, Ting-Wei CHIANG, Jerry Chang-Jui KAO, Hui-Zhong ZHUANG, Lee-Chung LU, Li-Chun TIEN, Meng-Hung SHEN, Shang-Chih HSIEH, Chi-Yu LU
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Publication number: 20240296272Abstract: A method includes forming a transistor layer; forming a first metallization layer, including: forming first conductors, aligned along alpha tracks, and representing input pins of a cell region including first and second input pins; and cutting lengths of the first and second input pins to accommodate at most two access points, each aligned to a different one of first to fourth beta tracks, the beta tracks to which are aligned the access points of the first input pin being different than the beta tracks to which are aligned the access points of the second input pin; and forming a second metallization layer, including: forming second conductors representing routing segments and a representing a power grid segment aligned with one of the beta tracks of access points of the first input pin or the access points of the second input pin.Type: ApplicationFiled: May 10, 2024Publication date: September 5, 2024Inventors: Pin-Dai SUE, Po-Hsiang HUANG, Fong-Yuan CHANG, Chi-Yu LU, Sheng-Hsiung CHEN, Chin-Chou LIU, Lee-Chung LU, Yen-Hung LIN, Li-Chun TIEN, Yi-Kan CHENG
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Patent number: 12073170Abstract: An integrated circuit structure includes a first, second and third power rail extending in a first direction, a first, second and third set of conductive structures extending in the second direction, and being located at a second level, and a first, second and third conductive structure extending in the second direction, and being located at a third level. The first conductive structure overlaps a first conductive structure of the corresponding first, second and third set of conductive structures. The second conductive structure overlaps a second conductive structure of the corresponding first, second and third set of conductive structures. The third conductive structure overlaps a third conductive structure of the corresponding first, second and third set of conductive structures.Type: GrantFiled: July 18, 2023Date of Patent: August 27, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jung-Chan Yang, Ting-Wei Chiang, Cheng-I Huang, Hui-Zhong Zhuang, Chi-Yu Lu, Stefan Rusu
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Patent number: 12057390Abstract: An integrated circuit (IC) structure includes first and second active areas extending in a first direction in a semiconductor substrate, first and second gate structures extending in a second direction perpendicular to the first direction, wherein each of the first and second gate structures overlies each of the first and second active areas, a first metal-like defined (MD) segment extending in the second direction between the first and second gate structures and overlying each of the first and second active areas, and an isolation structure positioned between the first MD segment and the first active area. The first MD segment is electrically connected to the second active area and electrically isolated from a portion of the first active area between the first and second gate structures.Type: GrantFiled: May 24, 2022Date of Patent: August 6, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Chi-Yu Lu, Yi-Hsun Chiu, Chih-Liang Chen, Chih-Yu Lai, Shang-Hsuan Chiu
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Publication number: 20240243163Abstract: The present disclosure provides a semiconductor structure including a vertical inductor. The semiconductor structure includes a first semiconductor substrate, a first conductive layer, a first magnetic layer, and a second magnetic layer. The first semiconductor substrate has a top surface, and the first conductive layer is vertically inserted into the first semiconductor substrate from the top surface of the first semiconductor substrate. The first magnetic layer is disposed in the first semiconductor substrate and surrounds the first conductive layer. The second magnetic layer is disposed over the first conductive layer and the first magnetic layer.Type: ApplicationFiled: January 13, 2023Publication date: July 18, 2024Inventors: WEI-YU CHOU, YANG-CHE CHEN, CHI-HUI LAI, YI-LUN YANG, HSIANG-TAI LU
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Publication number: 20240242860Abstract: The present invention proposes a resistor with two barrier layers covered by a protection layer, at both sides of the resistor to resist the moisture and sulphide penetration from both sides. The barrier can enhance the anti-corrosion ability of the resister. For a metallic barrier, a distance to the resistance layer and the internal electrode layer is necessary.Type: ApplicationFiled: January 12, 2023Publication date: July 18, 2024Inventors: SHUN-HO KUO, CHI-YU LU
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Patent number: 12019969Abstract: An integrated circuit includes at least one source/drain (S/D) line extending in second direction in a cell of the integrated circuit. The integrated circuit further includes a conductive element extending in a first direction in the cell of the integrated circuit, the first direction being perpendicular to the second direction. The integrated circuit further includes a power rail extending over the conductive element, wherein the power rail includes a first power rail portion and a second power rail portion, and an inner edge of the first power rail portion is offset from an inner edge of the second power rail portion, wherein the first power rail portion has a first edge and the second power rail portion has a second edge on the same side as the first edge of the first power rail portion, and the first edge and the second edge are laterally separated.Type: GrantFiled: July 22, 2021Date of Patent: June 25, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jung-Chan Yang, Hui-Zhong Zhuang, Ting-Wei Chiang, Chi-Yu Lu
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Patent number: 12009362Abstract: A method of making a semiconductor device includes forming a first active region on a first side of a substrate. The method further includes forming a first source/drain (S/D) electrode surrounding a first portion of the first active region. The method further includes forming an S/D connect via extending through the substrate. The method further includes flipping the substrate. The method further includes forming a second active region on a second side of the substrate, wherein the second side of the substrate is opposite to the first side of the substrate. The method further includes forming a second S/D electrode surrounding a first portion of the second active region, wherein the S/D connect directly contacts both the first S/D electrode and the second S/D electrode.Type: GrantFiled: July 27, 2023Date of Patent: June 11, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Chih-Yu Lai, Chih-Liang Chen, Chi-Yu Lu, Shang-Syuan Ciou, Hui-Zhong Zhuang, Ching-Wei Tsai, Shang-Wen Chang
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Patent number: 11995390Abstract: A circuit includes a first transistor, a second type-one transistor, a first type-two transistor, a third type-one transistor, a fourth type-one transistor, and a fifth type-one transistor. The first type-one transistor has a gate configured to have a first supply voltage of a first power supply. The first type-two transistor has a gate configured to have a second supply voltage of the first power supply. The third type-one transistor has a first active-region conductively connected with an active-region of the first type-one transistor. Third type-one transistor has a second active-region and a gate conductively connected to each other. The fifth type-one transistor has a first active-region conductively connected with the gate of the third type-one transistor and has a second active-region configured to have a first supply voltage of a second power supply. The fifth type-one transistor is configured to be at a conducting state.Type: GrantFiled: December 9, 2022Date of Patent: May 28, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Chi-Yu Lu, Ting-Wei Chiang, Hui-Zhong Zhuang, Jerry Chang Jui Kao, Pin-Dai Sue, Jiun-Jia Huang, Yu-Ti Su, Wei-Hsiang Ma
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Patent number: 11983479Abstract: A method of fabricating an integrated circuit includes placing a first set of conductive feature patterns on a first level, placing a second set of conductive feature patterns on a second level, placing a first set of via patterns between the second set of conductive feature patterns and the first set of conductive feature patterns, placing a third set of conductive feature patterns on a third level different from the first level and the second level, placing a second set of via patterns between the third set of conductive feature patterns and the second set of conductive feature patterns, and manufacturing the integrated circuit based on at least one of the above patterns of the integrated circuit.Type: GrantFiled: August 10, 2022Date of Patent: May 14, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jung-Chan Yang, Ting-Wei Chiang, Jerry Chang-Jui Kao, Hui-Zhong Zhuang, Lee-Chung Lu, Li-Chun Tien, Meng-Hung Shen, Shang-Chih Hsieh, Chi-Yu Lu
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Patent number: 11983475Abstract: A semiconductor device includes: M*1st conductors in a first layer of metallization (M*1st layer) and being aligned correspondingly along different corresponding ones of alpha tracks and representing corresponding inputs of a cell region in the semiconductor device; and M*2nd conductors in a second layer of metallization (M*2nd layer) aligned correspondingly along beta tracks, and the M*2nd conductors including at least one power grid (PG) segment and one or more of an output pin or a routing segment; and each of first and second ones of the input pins having a length sufficient to accommodate at most two access points; each of the access points of the first and second input pins being aligned to a corresponding different one of first to fourth beta tracks; and the PG segment being aligned with one of the first to fourth beta tracks.Type: GrantFiled: February 7, 2023Date of Patent: May 14, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Pin-Dai Sue, Po-Hsiang Huang, Fong-Yuan Chang, Chi-Yu Lu, Sheng-Hsiung Chen, Chin-Chou Liu, Lee-Chung Lu, Yen-Hung Lin, Li-Chun Tien, Yi-Kan Cheng
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Publication number: 20240096800Abstract: A semiconductor device includes first and second active regions extending in parallel in a substrate, a plurality of conductive patterns, each conductive pattern of the plurality of conductive patterns extending on the substrate across each of the first and second active regions, and a plurality of metal lines, each metal line of the plurality of metal lines overlying and extending across each of the first and second active regions. Each conductive pattern of the plurality of conductive patterns is electrically connected in parallel with each metal line of the plurality of metal lines.Type: ApplicationFiled: November 27, 2023Publication date: March 21, 2024Inventors: Fei Fan DUAN, Fong-yuan CHANG, Chi-Yu LU, Po-Hsiang HUANG, Chih-Liang CHEN
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Publication number: 20240096756Abstract: A method of making a semiconductor device includes manufacturing a first transistor over a first side of a substrate. The method further includes depositing a spacer material against a sidewall of the first transistor. The method further includes recessing the spacer material to expose a first portion of the sidewall of the first transistor. The method further includes manufacturing a first electrical connection to the transistor, a first portion of the electrical connection contacts a surface of the first transistor farthest from the substrate, and a second portion of the electrical connect contacts the first portion of the sidewall of the first transistor. The method further includes manufacturing a self-aligned interconnect structure (SIS) extending along the spacer material, wherein the spacer material separates a portion of the SIS from the first transistor, and the first electrical connection directly contacts the SIS.Type: ApplicationFiled: November 22, 2023Publication date: March 21, 2024Inventors: Chih-Yu LAI, Chih-Liang CHEN, Chi-Yu LU, Shang-Syuan CIOU, Hui-Zhong ZHUANG, Ching-Wei TSAI, Shang-Wen CHANG
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Publication number: 20240095433Abstract: An integrated circuit includes a first conductor segment intersecting a first active-region structure at a source/drain region and a second conductor segment intersecting a second active-region structure at a source/drain region. The first conductor segment and the second conductor segment are separated at proximal edges by a separation distance. A distance from a first horizontal cell boundary to a proximal edge of the first conductor segment is larger than a distance from a second horizontal cell boundary to a proximal edge of the second conductor segment by a predetermined distance that is a fraction of the separation distance.Type: ApplicationFiled: November 29, 2023Publication date: March 21, 2024Inventors: Chih-Yu LAI, Chih-Liang CHEN, Chi-Yu LU, Shang-Hsuan CHIU