Abstract: A substrate assembly is provided, including a first substrate, an active element layer, a plurality of first electrodes, a circuit substrate, and a plurality of second electrodes. The active element layer is disposed on the first substrate. The plurality of first electrodes are disposed on the first substrate and arranged along a first direction. The circuit substrate is partially overlapping the first substrate in a vertical projection direction. The plurality of second electrodes are disposed on the circuit substrate. A distance between the edge of one of the plurality of second electrodes and the edge of one of the plurality of first electrodes is greater than zero in the first direction, and a width of the one of the plurality of first electrodes is different from a width of the one of the plurality of second electrodes.

Abstract: An IC device includes first through third rows of fin field-effect transistors (FinFETs), wherein the second row is between and adjacent to each of the first and third rows, the FinFETs of the first row are one of an n-type or p-type, the FinFETs of the second and third rows are the other of the n-type or p-type, the FinFETs of the first and third rows include a first total number of fins, and the FinFETs of the second row include a second total number of fins one greater or fewer than the first total number of fins.

Abstract: Provided herein are systems and methods that use a video content analysis algorithm to measure and quantify repetitive motion activity of a designated body part, including velocity, acceleration, frequency, and duty cycle, without applying sensors or other instrumentation to the body, for the purpose of preventing repetitive motion injuries. In some embodiments, the video-based direct exposure assessment system uses marker-less video and a video content analysis algorithm. The video content analysis algorithm is able to recognize and identify the pattern of repetitive motion, through a process known as cyclic motion analysis. Determination of the cycle pattern provides parameters for determining a body part's activity level, and thereby allows determination of the body part's activity level.

Abstract: A detection method of a wafer pod includes performing an airtight test to the bolt hole on the cam of the wafer pod and determining the cam is abnormal when a result of the airtight test reveals that the bolt hole has an air-leak defect, wherein the bolt hole is positioned in back of the bolt of the cam.