Patents by Inventor Chia-Jung HSIEH

Chia-Jung HSIEH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12253879
    Abstract: An electronic device with a receiving function is provided. The electronic device is adapted to receive and shift out an object. The electronic device includes a device housing, an actuating unit, a linkage unit and a holder. The actuating unit is disposed in the device housing. The linkage unit is connected to the actuating unit, wherein the actuating unit is adapted to move the linkage unit. The holder is connected to the device housing and the linkage unit, wherein the holder is adapted to be rotated between an extended orientation and a received orientation relative to the device housing, and the object is detachably connected to the holder.
    Type: Grant
    Filed: March 27, 2023
    Date of Patent: March 18, 2025
    Assignee: QUANTA COMPUTER INC.
    Inventors: Chia-Jung Hsu, Shen-Pu Hsieh
  • Patent number: 10352965
    Abstract: A testing device includes a circuit board, a carrier, a probe pin, a main body, a shaft, a pressing portion and a resilient spiral spring. The carrier is used to hold a device under test (DUT). The probe pin is electrically connected to the circuit board and the DUT. The shaft is movably connected to the main body with a screwing rotation method. The pressing portion is connected to one end surface of the shaft. The resilient spiral spring is retractably coiled on the shaft, and one end of the resilient spiral spring being far away from the shaft extends in a transverse direction intersecting an axial direction of the shaft.
    Type: Grant
    Filed: June 11, 2017
    Date of Patent: July 16, 2019
    Assignees: GLOBAL UNICHIP CORPORATION, TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Yu-Ting Shih, Chia-Jung Hsieh, Chia-Jen Kao
  • Publication number: 20180196085
    Abstract: A testing device includes a circuit board, a carrier, a probe pin, a main body, a shaft, a pressing portion and a resilient spiral spring. The carrier is used to hold a device under test (DUT). The probe pin is electrically connected to the circuit board and the DUT. The shaft is movably connected to the main body with a screwing rotation method. The pressing portion is connected to one end surface of the shaft. The resilient spiral spring is retractably coiled on the shaft, and one end of the resilient spiral spring being far away from the shaft extends in a transverse direction intersecting an axial direction of the shaft.
    Type: Application
    Filed: June 11, 2017
    Publication date: July 12, 2018
    Inventors: Yu-Ting SHIH, Chia-Jung HSIEH, Chia-Jen KAO