Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.

Abstract: A multiplier-accumulator (MAC) block can be programmed to operate in one or more modes. When the MAC block implements at least one multiply-and-accumulate operation, the accumulator value can be zeroed without introducing clock latency or initialized in one clock cycle. To zero the accumulator value, the most significant bits (MSBs) of data representing zero can be input to the MAC block and sent directly to the add-subtract-accumulate unit. Alternatively, dedicated configuration bits can be set to clear the contents of a pipeline register for input to the add-subtract-accumulate unit. The least significant bits (LSBs) can be tied to ground and sent along the feedback path. To initialize the accumulator value, the MSBs of the initialization value can be input to the MAC block and sent directly to the add-subtract-accumulate unit. The LSBs can be sent to another multiplier that performs a multiply-by-one operation before being sent to the add-subtract-accumulate unit.

Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.