Patents by Inventor Chiao Hwang

Chiao Hwang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240148856
    Abstract: Provided is a vaccine composition for preventing respiratory syncytial virus (RSV) infection, which is in the form of a liposome formulation including a RSV antigen, monophosphoryl lipid A (MLA), and/or a cobalt-porphyrin-phospholipid (CoPoP) conjugate. The vaccine composition exhibits excellent vaccine efficacy from a RSV antigen with enhanced immunogenicity and a combination of immune adjuvants for enhancing immune activity and antigen presentation.
    Type: Application
    Filed: October 26, 2023
    Publication date: May 9, 2024
    Applicant: EUBIOLOGICS CO., LTD.
    Inventors: Chan Kyu LEE, Jonathan F. LOVELL, Yoon Hee WHANG, Woo Yeon HWANG, Hye Ji KIM, Min Chul PARK, Seok Kyu KIM, Wei-Chiao HUANG, Da Hui HA
  • Publication number: 20070008000
    Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.
    Type: Application
    Filed: August 1, 2006
    Publication date: January 11, 2007
    Inventors: Andy Lee, Wanli Chang, Cameron McClintock, John Turner, Brian Johnson, Chiao Hwang, Richard Chang, Richard Cliff
  • Publication number: 20060103419
    Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.
    Type: Application
    Filed: December 28, 2005
    Publication date: May 18, 2006
    Inventors: Martin Langhammer, Chiao Hwang, Gregory Starr
  • Publication number: 20050187997
    Abstract: A multiplier-accumulator (MAC) block can be programmed to operate in one or more modes. When the MAC block implements at least one multiply-and-accumulate operation, the accumulator value can be zeroed without introducing clock latency or initialized in one clock cycle. To zero the accumulator value, the most significant bits (MSBs) of data representing zero can be input to the MAC block and sent directly to the add-subtract-accumulate unit. Alternatively, dedicated configuration bits can be set to clear the contents of a pipeline register for input to the add-subtract-accumulate unit. The least significant bits (LSBs) can be tied to ground and sent along the feedback path. To initialize the accumulator value, the MSBs of the initialization value can be input to the MAC block and sent directly to the add-subtract-accumulate unit. The LSBs can be sent to another multiplier that performs a multiply-by-one operation before being sent to the add-subtract-accumulate unit.
    Type: Application
    Filed: February 20, 2004
    Publication date: August 25, 2005
    Inventors: Leon Zheng, Martin Langhammer, Nitin Prasad, Greg Starr, Chiao Hwang, Kumara Tharmalingam
  • Publication number: 20050038844
    Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.
    Type: Application
    Filed: December 19, 2003
    Publication date: February 17, 2005
    Inventors: Martin Langhammer, Chiao Hwang, Gregory Starr