Abstract: A multiplier-accumulator (MAC) block can be programmed to operate in one or more modes. When the MAC block implements at least one multiply-and-accumulate operation, the accumulator value can be zeroed without introducing clock latency or initialized in one clock cycle. To zero the accumulator value, the most significant bits (MSBs) of data representing zero can be input to the MAC block and sent directly to the add-subtract-accumulate unit. Alternatively, dedicated configuration bits can be set to clear the contents of a pipeline register for input to the add-subtract-accumulate unit.

Abstract: In a programmable logic device having a specialized functional block incorporating multipliers and adders, multiplication operations that do not fit neatly into the available multipliers are performed partially in the multipliers of the specialized functional block and partially in multipliers configured in programmable logic of the programmable logic device. Unused resources of the specialized functional block, including adders, may be used to add together the partial products produced inside and outside the specialized functional block. Some adders configured in programmable logic of the programmable logic device also may be used for that purpose.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A multiplier-accumulator (MAC) block can be programmed to operate in one or more modes. When the MAC block implements at least one multiply-and-accumulate operation, the accumulator value can be zeroed without introducing clock latency or initialized in one clock cycle. To zero the accumulator value, the most significant bits (MSBs) of data representing zero can be input to the MAC block and sent directly to the add-subtract-accumulate unit. Alternatively, dedicated configuration bits can be set to clear the contents of a pipeline register for input to the add-subtract-accumulate unit.

Abstract: In a programmable logic device having a specialized functional block incorporating multipliers and adders, multiplication operations that do not fit neatly into the available multipliers are performed partially in the multipliers of the specialized functional block and partially in multipliers configured in programmable logic of the programmable logic device. Unused resources of the specialized functional block, including adders, may be used to add together the partial products produced inside and outside the specialized functional block. Some adders configured in programmable logic of the programmable logic device also may be used for that purpose.

Abstract: A multiplier-accumulator (MAC) block can be programmed to operate in one or more modes. When the MAC block implements at least one multiply-and-accumulate operation, the accumulator value can be zeroed without introducing clock latency or initialized in one clock cycle. To zero the accumulator value, the most significant bits (MSBs) of data representing zero can be input to the MAC block and sent directly to the add-subtract-accumulate unit. Alternatively, dedicated configuration bits can be set to clear the contents of a pipeline register for input to the add-subtract-accumulate unit.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A programmable logic integrated circuit device (“PLD”) includes programmable logic and a dedicated (i.e., at least partly hard-wired) digital signal processing region for performing or at least helping to perform digital signal processing tasks that are unduly inefficient to implement in the more general-purpose programmable logic and/or that, if implemented in the programmable logic, would operate unacceptably or at least undesirably slowly. The digital signal processing region may include multiple digital signal processing stages. The digital signal processing region may include a multiplier stage and one or more stages that can operate in combination with the multiplier stage. The digital signal processing region has a plurality of modes such as for providing multiply-and-accumulate operation, multiply-and-add operation, etc.

Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.

Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE?Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A programmable logic integrated circuit device (“PLD”) includes programmable logic and a dedicated (i.e., at least partly hard-wired) digital signal processing region for performing or at least helping to perform digital signal processing tasks that are unduly inefficient to implement in the more general-purpose programmable logic and/or that, if implemented in the programmable logic, would operate unacceptably or at least undesirably slowly. The digital signal processing region may include multiple digital signal processing stages. The digital signal processing region may include a multiplier stage and one ore more stages that can operate in combination with the multiplier stage. The digital signal processing region has a plurality of modes such as for providing multiply-and-accumulate operation, multiply-and-add operation, etc.

Abstract: A bypassable latch circuit consumes less power in the bypass mode than it does in the latched mode. The circuit includes a flip-flop whose output is routed to an input of a multiplexer. The other input of the multiplexer is the input of the flip-flop as well. The multiplexer is used to select as the latch output either the registered or latched flip-flop output, or the flip-flop input. The flip-flop is modified by replacing the inverter at the flip-flop clock input with a logic gate that accepts as inputs both the clock input and a control input. The control input can cause the flip-flop to ignore the clock, preventing switching that consumes power by charging and discharging capacitive elements in the flip-flop.

Abstract: In a specialized functional region of a programmable logic device, in which certain components may not be used, those components can be placed in a low-power mode so that they do not switch. For example, in an adder which is not being used but is receiving inputs, the current path for the adding circuitry is interrupted, while the output is forced low. If the adder is a carry/look-ahead adder, the GENERATE and PROPAGATE signals normally used in subsequent stages to predict the value of the carry signal are forced to constant values even if the inputs to the adder are changing.

Abstract: A programmable logic integrated circuit device (“PLD”) includes programmable logic and a dedicated (i.e., at least partly hard-wired) digital signal processing region for performing or at least helping to perform digital signal processing tasks that are unduly inefficient to implement in the more general-purpose programmable logic and/or that, if implemented in the programmable logic, would operate unacceptably or at least undesirably slowly. The digital signal processing region may include multiple digital signal processing stages. The digital signal processing region may include a multiplier stage and one ore more stages that can operate in combination with the multiplier stage. The digital signal processing region has a plurality of modes such as for providing multiply-and-accumulate operation, multiply-and-add operation, etc.

Abstract: In a specialized functional region of a programmable logic device, in which certain components may not be used, those components can be placed in a low-power mode so that they do not switch. For example, in an adder which is not being used but is receiving inputs, the current path for the adding circuitry is interrupted, while the output is forced low. If the adder is a carry/look-ahead adder, the GENERATE and PROPAGATE signals normally used in subsequent stages to predict the value of the carry signal are forced to constant values even if the inputs to the adder are changing.

Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE−Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: In a programmable logic device having dedicated multiplier circuitry, some of the scan chain registers normally used for testing the device are located adjacent input registers of the multipliers. Those scan chain registers are ANDed with the input registers, and can be loaded with templates of ones and zeroes. This allows, e.g., subset multiplication if the least significant bits are loaded with zeroes and the remaining bits are loaded with ones. The multipliers preferably are arranged in blocks with other components, such as adders, that allow them to be configured as finite impulse response (FIR) filters. In such configurations, the scan chain registers can be used to load filter coefficients, avoiding the use of scarce logic and routing resources of the device.