Patents by Inventor Chiao-Yi Huang
Chiao-Yi Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230375611Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.Type: ApplicationFiled: July 31, 2023Publication date: November 23, 2023Applicant: Taiwan Semiconductor Manufacturing Company LimitedInventors: Chin-Hao Chang, Meng-Hsiu Wu, Chiao-Yi Huang, Manoj Mhala, Calvin Yi-Ping Chao
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Publication number: 20230358864Abstract: An apparatus, a processing circuitry and a method for measuring a distance to an object are provided. The apparatus comprising a light source, a direct time of flight (DTOF) sensor array configured to receive a reflected signal from the object, a processing circuitry coupled to the DTOF sensor array and comprising a first time to digital converter (TDC) and a second TDC, respectively disposed on opposite sides of the DTOF sensor array, the processing circuitry configured to receive, by the first TDC, a first photon detection signal transmitted by a first pixel, receive, by the second TDC, a second photon detection signal transmitted by the first pixel, and calculate a first distance from the first pixel to the object according to a first arrival time of the first photon detection signal detected by the first TDC and a second arrival time of the second signal detected by the second TDC.Type: ApplicationFiled: May 5, 2022Publication date: November 9, 2023Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chin Yin, Shang-Fu Yeh, Chiao-Yi Huang, Chih-Lin Lee
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Patent number: 11754616Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.Type: GrantFiled: May 27, 2020Date of Patent: September 12, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITEDInventors: Chin-Hao Chang, Meng-Hsiu Wu, Chiao-Yi Huang, Manoj M. Mhala, Calvin Yi-Ping Chao
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Publication number: 20210373068Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.Type: ApplicationFiled: May 27, 2020Publication date: December 2, 2021Applicant: Taiwan Semiconductor Manufacturing Company LimitedInventors: Chin-Hao Chang, Meng-Hsiu Wu, Chiao-Yi Huang, Manoj M. Mhala, Calvin Yi-Ping Chao
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Patent number: 10277849Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.Type: GrantFiled: March 30, 2018Date of Patent: April 30, 2019Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Calvin Yi-Ping Chao, Chin-Hao Chang, Kuo-Yu Chou, Shang-Fu Yeh, Chih-Lin Lee, Chiao-Yi Huang
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Publication number: 20180227531Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.Type: ApplicationFiled: March 30, 2018Publication date: August 9, 2018Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Calvin Yi-Ping Chao, Chin-Hao Chang, Kuo-Yu Chou, Shang-Fu Yeh, Chih-Lin Lee, Chiao-Yi Huang
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Patent number: 9955096Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.Type: GrantFiled: March 22, 2016Date of Patent: April 24, 2018Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Calvin Yi-Ping Chao, Shang-Fu Yeh, Chin-Hao Chang, Chih-Lin Lee, Kuo-Yu Chou, Chiao-Yi Huang
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Publication number: 20170280086Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.Type: ApplicationFiled: March 22, 2016Publication date: September 28, 2017Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Calvin Yi-Ping CHAO, Shang-Fu YEH, Chin-Hao CHANG, Chih-Lin LEE, Kuo-Yu CHOU, Chiao-Yi HUANG
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Publication number: 20150335274Abstract: A physiological signals detection device has a light source connecting to a control unit, a light detector and a processing unit. The light detector has a pixel sensor array including multiple light sensing elements. The light source emits light through a lens to the human body to generate reflected light. The light detector receives the reflected light to generate a sensing signal. Since the light sensing elements respectively receive different reflected light from different directions, the light sensing elements receiving reflected light from the noise are easily selected and eliminated from calculating the physiology value. Therefore, the calculated physiology value is more accurate.Type: ApplicationFiled: May 11, 2015Publication date: November 26, 2015Inventors: Tom Chang, Kao-Pin Wu, Chih-Jen Fang, Shang-Ming Hung, Chiao-Yi Huang, Chan-Peng Lo, Tseng Kuo-Tsai