Abstract: A method and system are disclosed for image registration based on hierarchical object modeling. Objects from an image are extracted. Each object is extracted based on at least one characteristic of the object. A hierarchical object tree is generated using the extracted objects based on the characteristics of the objects. An image registration map is defined based on the hierarchical object tree. The image registration map identifies each object of the hierarchical object tree in the image.

Abstract: A method and system are disclosed for extracting a golden template image of a unit. An image associated with the unit is obtained. A region within the image is selected. A first region growing algorithm extracts an object region using the selected region. A boundary tracing algorithm extracts an outer boundary of the object region using the extracted object region. A second region growing algorithm extracts a golden template image of the unit using the extracted object region.

Abstract: A method and an apparatus for the measurement and inspection of integrated circuit. Such an apparatus includes a camera for sensing an image of the integrated circuit (IC), an oblique light source, and a reflector. The camera has an optical axis passing through the IC normal to the plane of the IC. The oblique light source radiates light on the IC obliquely to the plane of the IC such that at least a portion of the oblique light source is positioned on one side of the optical axis. The reflector is positioned on the opposite side of the optical axis relative the portion of the oblique light source for reflecting light that crosses the optical axis from the oblique light source to the camera, such that at least a portion of the IC interposes between the portion of the oblique light source and the reflector. As a result, the shape of that portion of the IC is imaged on the camera by backlighting. The leads on the IC can be inspected in this manner.

Abstract: An optical inspection system for determining the positional information of a leaded electrical component with respect to a reference is provided. The system has a datum placed in proximity to leads of the leaded electrical component that provides the reference. It also has a light source that provides light that impinges on the leads and the datum so that the images of points on the leads and the datum are formed along various optical paths. The light source is set up so that a point on the leads and a point on the datum will lie in the same plane as their images along at least two optical paths that cross each other at an angle. In addition, the system has an imaging subsystem that captures the images along the two optical paths. The subsystem also correlates and analyses the captured images to provide positional information of the point on the leads with respect to the point on the datum.