Abstract: A system and method for characterizing the jitter of a periodic signal. Samples of the signal are taken with a sampling device. A set of samples representing a particular value of the signal in multiple cycles of the periodic signal is collected. Those values are formed into a histogram. The histogram is matched to a probability distribution function. By identifying parameters that shape the probability distribution function to match the histogram of actual samples, characteristics of the jitter are determined. This technique may be employed as part of the calibration or verification of the jitter injection instrument such as might be used for testing semiconductor devices. Measurements may be made with a sampling device that is calibrated to NIST standards. In this way, the jitter measurements become NIST traceable.