Patents by Inventor Chie Ishikawa

Chie Ishikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Surface defect inspecting method and device
    Patent number: 7599050
    Abstract: A method of inspecting an inspection target surface comprises: irradiating an irradiation light having a predetermined pattern on the inspection target surface; imaging the surface irradiated with the irradiation light; and inspecting the inspection target surface based on an obtained image of the inspection target surface. The irradiation light irradiated from an irradiation face has a mesh-like pattern including meshes of a same shape. Each mesh has an irradiation area smaller than a non-irradiation area in a plane normal to the optical axis. The inspection target surface is inspected based on lightness/darkness information of an image area in the obtained image corresponding to a non-irradiated area in the inspection target surface. A light point having intermediate brightness and formed in a dark face formed within the mesh is extracted as a defect candidate.
    Type: Grant
    Filed: October 20, 2004
    Date of Patent: October 6, 2009
    Assignee: Daihatsu Motor Co., Ltd.
    Inventors: Chie Ishikawa, Makoto Iwata, Mamoru Sakaue, Keisuke Kuroki
  • Surface Defect Inspecting Method And Device
    Publication number: 20070206182
    Abstract: A method of inspecting an inspection target surface comprises: irradiating an irradiation light having a predetermined pattern on the inspection target surface; imaging the surface irradiated with the irradiation light; and inspecting the inspection target surface based on an obtained image of the inspection target surface. The irradiation light irradiated from an irradiation face has a mesh-like pattern including meshes of a same shape. Each mesh has an irradiation area smaller than a non-irradiation area in a plane normal to the optical axis. The inspection target surface is inspected based on lightness/darkness information of an image area in the obtained image corresponding to a non-irradiated area in the inspection target surface. A light point having intermediate brightness and formed in a dark face formed within the mesh is extracted as a defect candidate.
    Type: Application
    Filed: October 20, 2004
    Publication date: September 6, 2007
    Applicant: DAIHATSU MOTOR CO., LTD.
    Inventors: Chie Ishikawa, Makoto Iwata, Mamoru Sakaue, Keisuke Kuroki