Abstract: A testing device and a testing method for detecting a stitching defect of a panoramic camera are provided. The testing method includes: accessing the panoramic camera to obtain a stitched image, wherein the stitched image includes a chart image corresponding to a chart, wherein the chart includes multiple black stripes and multiple white stripes; generating a defect image marked with the stitching defect according to the chart image; and outputting the defect image.

Abstract: An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

Abstract: An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

Abstract: An automatic focusing method is provided, which is realized through an imaging device as based on the multi-stage search principle and a focusing function. Thus the focusing position search is implemented in three stages of: the optimal focusing position gross search, the wave packet interval search, and the optimal focusing position minute search, with the respective stages having different search-step-magnitudes. Wherein, the integer times of one half the wavelength of the incident light of the imaging device is utilized as the search-step-magnitude to search for the maximum value of the focusing function in the wave packet interval, and define the focusing position corresponding to the maximum value of the focusing function as the optimal focusing position, hereby obtaining the optimal focusing position in a speedy and efficient manner.