Abstract: A system and methods of forming a dielectric material within a trench are described herein. In an embodiment of the method, the method includes introducing a first precursor into a trench of a dielectric layer, such that portions of the first precursor react with the dielectric layer and attach on sidewalls of the trench. The method further includes partially etching portions of the first precursor on the sidewalls of the trench to expose upper portions of the sidewalls of the trench. The method further includes introducing a second precursor into the trench, such that portions of the second precursor react with the remaining portions of the first precursor to form the dielectric material at the bottom of the trench.

Abstract: An improved structure of an ashtray includes a body, a hollowed rim at the center of the body, an ash disk placed on the bottom of the hollowed rim, and multiple needles erected at equal distance from one another on the bottom of the hollowed rim; the ash disk being provided with multiple pores in quantity and arrangement same as that of those needles; the ash disk penetrating through those needles before being secured on the bottom of the hollowed rim; a burning butt being fast and automatically killed by inserting the butt upright into tips of those needles; a burning butt when not desired to be put out firmly resting at a certain inclination on tips of those needles; and dead butts and ashes being easily cleaned by removing the ash disk to dump them.

Abstract: A dual-chip integrated circuit package and a method for manufacturing such a dual-chip integrated circuit package are proposed, which can help prevent the occurrence of cracking and delamination in the chips and the occurrence of voids in the encapsulant during the manufacture process. The dual-chip integrated circuit package is constructed on a leadframe having a plurality of first leads and a plurality of second leads and at least a pair of support members between the first and second leads. Further, the dual-chip integrated circuit package includes at least one support member attached to the front side of the first integrated circuit chip for providing a support to the bonding pads on the second integrated circuit chip; the support member being not smaller in dimension than the area where the bonding pads on the second integrated circuit chip are located.

Abstract: A dual-chip integrated circuit package and a method for manufacturing such a dual-chip integrated circuit package are proposed, which can help prevent the occurrence of cracking and delamination in the chips and the occurrence of voids in the encapsulant during the manufacture process. The dual-chip integrated circuit package is constructed on a leadframe having a plurality of first leads and a plurality of second leads and at least a pair of support members between the first and second leads. Further, the dual-chip integrated circuit package includes at least one support member attached to the front side of the first integrated circuit chip for providing a support to the bonding pads on the second integrated circuit chip; the support member being not smaller in dimension than the area where the bonding pads on the second integrated circuit chip are located.

Abstract: A dual-chip integrated circuit package and a method for manufacturing such a dual-chip integrated circuit package are proposed, which can help prevent the occurrence of cracking and delamination in the chips and the occurrence of voids in the encapsulant during the manufacture process. The dual-chip integrated circuit package is constructed on a leadframe having a plurality of first leads and a plurality of second leads and at least a pair of support members between the first and second leads. Further, the dual-chip integrated circuit package includes at least one support member attached to the front side of the first integrated circuit chip for providing a support to the bonding pads on the second integrated circuit chip; the support member being not smaller in dimension than the area where the bonding pads on the second integrated circuit chip are located.