Abstract: An optoelectronic device includes a first semiconductor layer, a second semiconductor layer and an active layer between the first semiconductor layer and the second semiconductor layer; a first insulating layer on the second semiconductor layer and including a plurality of first openings exposing the first semiconductor layer, wherein the first openings include a first group and a second group; a third electrode on the first insulating layer and including a first extended portion and a second extended portion, wherein the first extended portion and the second extended portion are respectively electrically connected to the first semiconductor layer through the first group of the first openings and the second group of the first openings, and wherein the number of the first group of the first openings is different from the number of the second group of the first openings; and a plurality of fourth electrodes on the second insulating layer and electrically connected to the second semiconductor layer, wherein in a

Abstract: A method for facilitating basic input and output system (BIOS) testing is provided. In the method, a BIOS program code to be tested is loaded into a memory unit by a BIOS debugging card to execute a boot operation testing. The method of BIOS testing utilizes an uninterruptible power supply memory disposed on the motherboard. The uninterruptible power supply memory is powered with a battery, thus it can store the data of a command in executing during shutdown. By using this characteristic of the uninterruptible power supply memory, the tester can still obtain the debugging code last stored during the previous boot from the uninterruptible power supply memory when rebooting, thus preventing the debugging code generated in the BIOS debugging flow from disappearing due to the abnormal shutdown and resulting in the failure to get the source of the problem for the tester, increasing the efficiency of debugging.

Abstract: A method for facilitating basic input and output system (BIOS) testing is provided. In the method, a BIOS program code to be tested is loaded into a memory unit by a BIOS debugging card to execute a boot operation testing. The method of BIOS testing utilizes an uninterruptible power supply memory disposed on the motherboard. The uninterruptible power supply memory is powered with a battery, thus it can store the data of a command in executing during shutdown. By using this characteristic of the uninterruptible power supply memory, the tester can still obtain the debugging code last stored during the previous boot from the uninterruptible power supply memory when rebooting, thus preventing the debugging code generated in the BIOS debugging flow from disappearing due to the abnormal shutdown and resulting in the failure to get the source of the problem for the tester, increasing the efficiency of debugging.