Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.

Abstract: A knee brace for rehabilitation provides a stable support for an injured knee using a four-crank mechanism. Positioning pins are used to fix limiting blocks pivoted to the upper and lower braces. It limits the moving range of the crank between the upper and lower braces, restricting the moving angles of the upper and lower braces. Besides, the buffer pads are covered at the pivotal axes of the upper and lower braces in order to alleviate the collision between joint surfaces during the motion of injured knee. Such a mechanism protects the rehabilitating knee joint. The disclosed structure can solve the failure problem of the knee brace for rehabilitation due to a loose pin in the prior art. The counterforce to injured knee from the performance of knee brace reduced for rehabilitation can prevent the user's knee joint from further injuries.