Abstract: An integrated circuit includes an output circuit. The output circuit includes first, second, and third external contacts, a first output buffer circuit coupled to the first external contact, a first resistive circuit coupled between the first external contact and the second external contact, a second output buffer circuit coupled to the third external contact, and a second resistive circuit coupled between the second external contact and the third external contact. The output circuit has a test mode of operation to test for leakage current on the first and the third external contacts in response to receiving a first voltage applied externally to the first and the second resistive circuits through the second external contact. The output circuit has a user mode of operation wherein a supply voltage is applied externally to the first and the second resistive circuits through the second external contact.

Abstract: The present invention discloses a method of testing an analog-to-digital converter (ADC). The method includes receiving a series of analog signals from a tester site, converting the series of analog signals to a series of digital code words using an ADC, evaluating the ADC based on the series of digital code words using an ADC test setup and generating an output signal identifying whether the ADC has passed the testing.

Abstract: Integrated circuits (ICs) with configurable test pins and a method of testing an IC are disclosed. An IC has input/output (I/O) pins that can be configured either as a test input pin, a test output pin or a user I/O pin. Selector circuits are used to selectively route and couple the I/O pins to various logic blocks and test circuitry on the IC. Selector circuits are also used to selectively couple either a user output or a test output to different I/O pins on the IC. Switches are used to configure the selector circuits and route test signals within the IC. Different configurations of the switches determine how the signals are routed. Test input signals from an I/O pin may be routed to any test circuitry within the IC and test output signals from a test circuit may be routed to any I/O pin on the IC.