Abstract: A complementary current-steering digital-to-analog converter (DAC) including a p-type DAC as well as an n-type DAC is shown. The p-type DAC has p-type current sources, and the n-type DAC has n-type current sources. The p-type and n-type current sources are coupled to a first input terminal or a second input terminal of a transimpedance amplifier (TIA) according to the digital input of the complementary current-steering DAC. In response to the digital input changing from a first value to a second value that is greater than the first value, one or more n-type current sources connected to the second input terminal of the TIA are switched so that they are connected to the first input terminal of the TIA.

Abstract: A circuit with a pseudo class-AB structure is shown. The circuit has an output stage, a first capacitor, and a first impedance component. The output stage has a first PMOS (p-type Metal-Oxide-Semiconductor Field-Effect Transistor) and a first NMOS (n-type MOSFET). The first connection node between the drain terminal of the first PMOS and the drain terminal of the first NMOS is coupled to the first output terminal of the circuit. The first capacitor is coupled between the gate terminal of the first PMOS and the gate terminal of the first NMOS. The first impedance component is coupled in parallel with the first capacitor between the gate terminal of the first PMOS and the gate terminal of the first NMOS.

Abstract: A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

Abstract: A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

Abstract: A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

Abstract: A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

Abstract: A noise-shaping successive approximation analog-to-digital converter (NS-SAR ADC) using a passive noise-shaping technique with 1-input-pair SAR comparator is introduced. A residue sampling and integration circuit is coupled between a DAC and the comparator, for sampling a residue voltage generated by the DAC and charge-sharing of the sampled residue voltage. A first integral capacitor is coupled between a first input terminal of a comparator and a first output terminal of a DAC. After a first residue capacitor samples a residue generated by the DAC, the first residue capacitor is coupled to the first integral capacitor for charge-sharing of the residue voltage.

Abstract: A noise-shaping successive approximation analog-to-digital converter (NS-SAR ADC) using a passive noise-shaping technique with 1-input-pair SAR comparator is introduced. A residue sampling and integration circuit is coupled between a DAC and the comparator, for sampling a residue voltage generated by the DAC and charge-sharing of the sampled residue voltage. A first integral capacitor is coupled between a first input terminal of a comparator and a first output terminal of a DAC. After a first residue capacitor samples a residue generated by the DAC, the first residue capacitor is coupled to the first integral capacitor for charge-sharing of the residue voltage.

Abstract: A metal-oxide-metal (MOM) capacitor is provided in the present invention. The MOM capacitor includes a capacitor element, wherein the capacitor element includes a first electrode and a second electrode. A projection of the first electrode includes a closed pattern in the vertical projection direction. A projection of the second electrode is surrounded by the closed pattern of the projection of the first electrode in the vertical projection direction.

Abstract: A metal-oxide-metal (MOM) capacitor is provided in the present invention. The MOM capacitor includes a capacitor element, wherein the capacitor element includes a first electrode and a second electrode. A projection of the first electrode includes a closed pattern in the vertical projection direction. A projection of the second electrode is surrounded by the closed pattern of the projection of the first electrode in the vertical projection direction.

Abstract: An analog to digital converter having an input stage amplifier array, an input stage voltage divider array, a comparator array and an encoder. The input stage amplifier array calculates and amplifies the difference between an input signal and a plurality of reference signals to generate a plurality of amplified differences. The input stage voltage divider array averages every two adjacent amplified differences to generate a plurality of average signals. The comparator array compares the average signals with a threshold value and outputs the compared results to the encoder for digital data representing the value of the input signal.