Abstract: A semiconductor device includes a substrate with a high voltage region and a low voltage region. A first deep trench isolation is disposed within the high voltage region. The first deep trench isolation includes a first deep trench and a first insulating layer filling the first deep trench. The first deep trench includes a first sidewall and a second sidewall facing the first sidewall. The first sidewall is formed by a first plane and a second plane. The edge of the first plane connects to the edge of the second plane. The slope of the first plane is different from the slope of the second plane.

Abstract: An optical element driving mechanism is configured to receive light. The light is incident to a light-path adjustment element via an incident axis, and travels into the optical element driving mechanism along a first axis, and the incident axis is not parallel to the first axis. The optical element driving mechanism includes a movable portion, a fixed portion, and a driving assembly. The movable portion has a receiving space configured to connect an optical element. The fixed portion includes a base, the movable portion is movable relative to the fixed portion, and the base has a first surface facing the movable portion. The driving assembly is configured to drive the movable portion to move. The movable portion further includes an opening connected to the receiving space, and when viewed along the first axis, the sidewall of the optical element is located between the opening and the first surface.

Abstract: An optical element driving mechanism is provided and includes a fixed assembly, a movable assembly, a driving assembly and a circuit assembly. The movable assembly is configured to connect an optical element, the movable assembly is movable relative to the fixed assembly, and the optical element has an optical axis. The driving assembly is configured to drive the movable assembly to move relative to the fixed assembly. The circuit assembly includes a plurality of circuits and is affixed to the fixed assembly.

Abstract: An optical element driving mechanism is provided and includes a movable portion and a fixed portion. The movable portion includes a carrier for carrying an optical member with a first optical axis. The fixed portion has a top surface, a first side surface and a second side surface. The top surface extends in a direction that is parallel to the first optical axis. The first side surface and the second side surface extend in a direction that is not parallel to the first optical axis from the edge of the top surface and face different sides of the optical member. The shortest distance between the optical member and the first side surface is shorter than the shortest distance between the optical member and the second side surface. The optical element driving mechanism includes a noise-reducing structure configured to avoid a noise entering a photosensitive member.

Abstract: An optical element driving mechanism includes a movable portion, a fixed portion, a driving assembly, a guiding assembly, and a metallic member. The movable portion is configured to connect an optical element. The optical element is configured to correspond to light reflected by a reflection element, and the reflection element is configured to change a traveling direction of the light from an incident direction to a first direction. The fixed portion includes a base, and the movable portion is movable relative to the fixed portion. The driving assembly is configured to drive the movable portion to move relative to the fixed portion. The guiding assembly includes a plurality of guiding elements. The metallic member is disposed in the base. When viewed from the incident direction, the metallic member is at least partially located between the guiding elements.

Abstract: A computer system and a debugging method thereof are provided. The computer system includes a circuit board, a memory, a circuit board image, and a processor. The circuit board includes a plurality of connection interfaces configured to be electrically coupled to a plurality of hardware devices. The memory stores a basic input/output system program. The basic input/output system program includes a power-on self-test program. The processor loads the basic input/output system program to perform a boot process when the computer system is powered on, reads and executes the power-on self-test program to detect the hardware devices electrically coupled to the connection interfaces, displays the circuit board image on a display, and displays a mark pattern on the circuit board image corresponding to a position of a connection interface image of an abnormal hardware device when the hardware device is detected to be abnormal.

Abstract: A computer system and a debugging method thereof are provided. The computer system includes a circuit board, a memory, a circuit board image, and a processor. The circuit board includes a plurality of connection interfaces configured to be electrically coupled to a plurality of hardware devices. The memory stores a basic input/output system program. The basic input/output system program includes a power-on self-test program. The processor loads the basic input/output system program to perform a boot process when the computer system is powered on, reads and executes the power-on self-test program to detect the hardware devices electrically coupled to the connection interfaces, displays the circuit board image on a display, and displays a mark pattern on the circuit board image corresponding to a position of a connection interface image of an abnormal hardware device when the hardware device is detected to be abnormal.