Patents by Inventor Chih-Peng HSIEH

Chih-Peng HSIEH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190086443
    Abstract: A round probe of a probe card device includes a metallic pin and insulating latch. The outside diameter of the metallic pin is smaller than or equal to 40 ?m. The metallic pin includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, and a first contacting segment and a second contacting segment respectively extending from the first and second connecting segments in two opposite directions away from the middle segment. The insulating latch is formed on a part of the first contacting segment, and an end portion of the first contacting segment protruding from the insulating latch is defined as a protrusion. A maximum distance between an outer surface of the insulating latch and an adjacent outer surface of the metallic pin is smaller than or equal to the outside diameter of the metallic pin.
    Type: Application
    Filed: November 13, 2017
    Publication date: March 21, 2019
    Inventors: WEI-JHIH SU, CHIH-PENG HSIEH
  • Publication number: 20190072586
    Abstract: The instant disclosure provides a probe assembly and a probe structure thereof. The probe structure includes a metal main portion, a covering layer and an insulating layer. The metal main portion has a first end portion, a second end portion corresponding to the first end portion, a connecting portion connected between the first and the second end portions and a surrounding surface surrounding the first end portion, the second end portion and the connecting portion. The covering layer includes a first covering layer disposed on a surrounding surface located on the first end portion, a second covering layer disposed on a surrounding surface located on the second end portion and a third covering layer disposed on a surrounding surface located on the connecting portion. The insulating layer is disposed on the third covering layer for exposing the first and second covering layer.
    Type: Application
    Filed: January 22, 2018
    Publication date: March 7, 2019
    Inventors: WEI-JHIH SU, CHIH-PENG HSIEH
  • Publication number: 20190072584
    Abstract: A rectangular probe of a probe card device includes a metallic pin and a metallic reinforcing body. The metallic pin includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, a first contacting segment extending from the first connecting segment in a direction away from the middle segment, and a second contacting segment extending from the second connecting segment in a direction away from the middle segment. The metallic reinforcing body is integrally formed on the middle segment. The Young's modulus of the metallic reinforcing body is larger than that of the metallic pin. The electric conductivity of the metallic pin is larger than that of the metallic reinforcing body. An outside diameter jointly formed by the metallic reinforcing body and the middle segment is larger than an outside diameter of the second connecting segment.
    Type: Application
    Filed: November 13, 2017
    Publication date: March 7, 2019
    Inventors: WEI-JHIH SU, CHIH-PENG HSIEH
  • Patent number: 9970960
    Abstract: A probe having a sliding rail is provided and includes a probe head, a probe tail, an elastic element made of an elastic material and connected between the probe head and the probe tail, and a sliding rail assembly. The sliding rail assembly includes a slide rail and a position limit protrusion. The slide rail has a fixed end and a free end. The fixed end is fixedly connected to the probe tail, and the free end extends to the probe head. The position limit protrusion is fixedly connected to the probe head, and has a sliding slot formed thereon through which the slide rail can pass. The sliding rail assembly is made of a conductive material, and a cross-section area of the slide rail is greater than a cross-section area of the elastic material of the elastic element.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: May 15, 2018
    Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.
    Inventor: Chih-Peng Hsieh
  • Publication number: 20180080955
    Abstract: A bolt type probe is provided, including a probe head having a bolt at one end thereof, a probe tail having a bolt hole corresponding to the bolt, an elastic element connected with the probe head and the probe tail. At least one portion of the bolt of the probe head is inserted in the bolt hole of the probe tail, and the bolt is moved relative to the bolt hole along with a movement of the elastic element.
    Type: Application
    Filed: February 21, 2017
    Publication date: March 22, 2018
    Inventor: Chih-Peng HSIEH
  • Publication number: 20180074095
    Abstract: A probe having a sliding rail is provided and includes a probe head, a probe tail, an elastic element made of an elastic material and connected between the probe head and the probe tail, and a sliding rail assembly. The sliding rail assembly includes a slide rail and a position limit protrusion. The slide rail has a fixed end and a free end. The fixed end is fixedly connected to the probe tail, and the free end extends to the probe head. The position limit protrusion is fixedly connected to the probe head, and has a sliding slot formed thereon through which the slide rail can pass. The sliding rail assembly is made of a conductive material, and a cross-section area of the slide rail is greater than a cross-section area of the elastic material of the elastic element.
    Type: Application
    Filed: February 23, 2017
    Publication date: March 15, 2018
    Inventor: Chih-Peng HSIEH
  • Publication number: 20180017593
    Abstract: A probe structure is provided, including two probe heads for electrically contacting with the two objects, respectively, an elastic buffer portion forming a hollow space therein, a conductive portion being disposed within the hollow space and thereby being surrounded by the elastic buffer portion, and having two ends respectively electrically being connected to the two probe heads. When the two probe heads do not contact with the two objects electrically, the conductive portion is linearly extended between the two probe heads.
    Type: Application
    Filed: February 8, 2017
    Publication date: January 18, 2018
    Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
    Inventors: Wen Tsung LI, Kai Chieh HSIEH, Chih-Peng HSIEH