Abstract: An I2C test single chip for testing an I2C interface of an electronic device is disclosed. The I2C test single chip is electrically connected to a test-environment-providing system outputting a test signal to the electronic device and outputting a second signal to the I2C test single chip simultaneously. The I2C test single chip includes a first interface, a second interface, and a chip body. The first interface, which is also an I2C interface, is electrically connected to the I2C interface of the electronic device for receiving a first signal from the I2C interface of the electronic device in response to the test signal. The second interface is electrically connected to the test-environment-providing system for receiving the second signal. The chip body is used for taking a processing procedure to assist the test-environment-providing system to test the I2C interface of the electronic device in response to the first signal and the second signal.