Patents by Inventor Chih-Sheng Tung

Chih-Sheng Tung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for generating featured test pattern
    Patent number: 10067186
    Abstract: An method of generating a featured scan pattern for test includes: providing a plurality of predetermined test patterns to perform test on a plurality of devices under test (DUT) under a stress condition to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine a feature value corresponding to a failure feature for each DUT; and generating at least one featured test pattern according to the feature value of each DUT.
    Type: Grant
    Filed: September 10, 2016
    Date of Patent: September 4, 2018
    Assignee: MEDIATEK INC.
    Inventors: Harry Hai Chen, Shih-Hua Kuo, Chih-Sheng Tung
  • METHOD AND APPARATUS FOR GENERATING FEATURED TEST PATTERN
    Publication number: 20160377678
    Abstract: An method of generating a featured scan pattern for test includes: providing a plurality of predetermined test patterns to perform test on a plurality of devices under test (DUT) under a stress condition to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine a feature value corresponding to a failure feature for each DUT; and generating at least one featured test pattern according to the feature value of each DUT.
    Type: Application
    Filed: September 10, 2016
    Publication date: December 29, 2016
    Inventors: Harry Hai Chen, Shih-Hua Kuo, Chih-Sheng Tung
  • Method and apparatus for generating featured scan pattern
    Patent number: 9465071
    Abstract: An method of generating a featured scan pattern for scan test includes: providing a plurality of predetermined scan patterns to perform scan test on a plurality of devices under test (DUT) under a stress condition to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine a feature value corresponding to a failure feature for each DUT; and generating at least one featured scan pattern according to the feature value of each DUT.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: October 11, 2016
    Assignee: MEDIATEK INC.
    Inventors: Harry Hai Chen, Shih-Hua Kuo, Chih-Sheng Tung
  • METHOD AND APPARATUS FOR GENERATING FEATURED SCAN PATTERN
    Publication number: 20150253384
    Abstract: An method of generating a featured scan pattern for scan test includes: providing a plurality of predetermined scan patterns to perform scan test on a plurality of devices under test (DUT) under a stress condition to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine a feature value corresponding to a failure feature for each DUT; and generating at least one featured scan pattern according to the feature value of each DUT.
    Type: Application
    Filed: March 3, 2015
    Publication date: September 10, 2015
    Inventors: Harry Hai Chen, Shih-Hua Kuo, Chih-Sheng Tung