Abstract: An adaptive learning power modeling method includes: sampling at least one of a plurality of network components to form a power consumption evaluation network according to at least one parameter within a parameter range; evaluating a predictive power consumption of a to-be-measured circuit by the power consumption evaluation network; training and evaluating an actual power consumption and the predictive power consumption of the to-be-measured circuit by the power consumption evaluation network to obtain an evaluation result; and performing training according to the evaluation result to determine whether to change the power consumption evaluation network.

Abstract: A DNN hardware accelerator and an operation method of the DNN hardware accelerator are provided. The DNN hardware accelerator includes: a network distributor for receiving an input data and distributing respective bandwidth of a plurality of data types of a target data amount based on a plurality of bandwidth ratios of the target data amount; and a processing element array coupled to the network distributor, for communicating data of the data types of the target data amount between the network distributor based on the distributed bandwidth of the data types.

Abstract: A processing element architecture adapted to a convolution comprises a plurality of processing elements and a delayed queue circuit. The plurality of processing elements includes a first processing element and a second processing element, wherein the first processing element and the second processing element perform the convolution according to a shared datum at least. The delayed queue circuit connects to the first processing element and connects to the second processing element. The delayed queue circuit receives the shared datum sent by the first processing element, and sends the shared datum to the second processing element after receiving the shared datum and waiting for a time interval.

Abstract: An adaptive learning power modeling method includes: sampling at least one of a plurality of network components to form a power consumption evaluation network according to at least one parameter within a parameter range; evaluating a predictive power consumption of a to-be-measured circuit by the power consumption evaluation network; training and evaluating an actual power consumption and the predictive power consumption of the to-be-measured circuit by the power consumption evaluation network to obtain an evaluation result; and performing training according to the evaluation result to determine whether to change the power consumption evaluation network.

Abstract: A DNN hardware accelerator and an operation method of the DNN hardware accelerator are provided. The DNN hardware accelerator includes: a network distributor for receiving an input data and distributing respective bandwidth of a plurality of data types of a target data amount based on a plurality of bandwidth ratios of the target data amount; and a processing element array coupled to the network distributor, for communicating data of the data types of the target data amount between the network distributor based on the distributed bandwidth of the data types.

Abstract: A memory transaction-level modeling method and a memory transaction-level modeling system are provided. The memory transaction-level modeling method is used for simulating the operation of outputting at least one command to the memory. The memory includes a plurality of banks each of which corresponds with a bank status table. The memory transaction-level modeling method includes the following steps: An event is received. Whether one of the bank status tables is needed to be updated is determined. If one of the bank status tables is needed to be updated, this bank status table is recovered according to a TMP queue. A command is outputted to the memory according to a command queue. The outputted command is stored in the TMP queue. Some of the bank status tables are updated and others of the bank status tables are kept unchanged.

Abstract: A memory transaction-level modeling method and a memory transaction-level modeling system are provided. The memory transaction-level modeling method is used for simulating the operation of outputting at least one command to the memory. The memory includes a plurality of banks each of which corresponds with a bank status table. The memory transaction-level modeling method includes the following steps: An event is received. Whether one of the bank status tables is needed to be updated is determined. If one of the bank status tables is needed to be updated, this bank status table is recovered according to a TMP queue. A command is outputted to the memory according to a command queue. The outputted command is stored in the TMP queue. Some of the bank status tables are updated and others of the bank status tables are kept unchanged.

Abstract: A method for system simulation includes the steps of: simulating the operation of a first circuit during N clock periods based on a first model and a simulation granularity, and adjusting the simulation granularity based on the input signal or the output signal corresponding to the first model. A non-transitory computer-readable recording medium corresponding to the method is also provided.

Abstract: A probing system for an integrated circuit device, which transmits a testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system includes a test head having a first transceiving module. There is a test station having a test unit coupled to the test head to perform a test operation. A communication module has a second transceiving module configured to exchange data with the first transceiving module in a wireless manner. There is an integrated circuit device having a core circuit being tested, and a test module having a self-test circuit coupled to the core circuit and the communication module for performing the core circuit self-testing.

Abstract: The present invention proposed a trace compression method for a debug and trace interface of a microprocessor, in which the debug and trace interface is associated with a plurality of registers for storing data. The trace compression method comprises the steps of: (1) finding register content of each of the registers in a first cycle and register content of each of the registers in a second cycle, in which the second cycle is next to the first cycle; (2) calculating difference of the register content of each of the registers in the second cycle and the register content of each of the registers in the first cycle; and (3) packing the differences of the register contents into data trace packets, in which the differences of the register contents of adjacent registers are condensed into a single data trace packet when the differences of the register contents of the adjacent registers are zeroes.

Abstract: A scheduling method for ECC computation processed in a plurality of arithmetic units comprises a coarse-grained scheduling step for systematically scheduling an ECC computation operation and a fine-grained scheduling step for refining the scheduled ECC computation operation.

Abstract: A probing system for integrated circuit device, which transmits testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system comprising a test head having a first transceiving module; a test station having a test unit couple to the test head to perform test operation; a communication module having a second transceiving module configured to exchange data with the first transceiving module; an integrated circuit device having at least one core circuit being tested; and at least one test module having a self-test circuit couple to the core circuit and the communication module for performing the core circuit self-testing.

Abstract: The present invention proposed a trace compression method for a debug and trace interface of a microprocessor, in which the debug and trace interface is associated with a plurality of registers for storing data. The trace compression method comprises the steps of: (1) finding register content of each of the registers in a first cycle and register content of each of the registers in a second cycle, in which the second cycle is next to the first cycle; (2) calculating difference of the register content of each of the registers in the second cycle and the register content of each of the registers in the first cycle; and (3) packing the differences of the register contents into data trace packets, in which the differences of the register contents of adjacent registers are condensed into a single data trace packet when the differences of the register contents of the adjacent registers are zeroes.

Abstract: A probing system for integrated circuit device, which transmits testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system comprising a test head having a first transceiving module; a test station having a test unit couple to the test head to perform test operation; a communication module having a second transceiving module configured to exchange data with the first transceiving module; an integrated circuit device having at least one core circuit being tested; and at least one test module having a self-test circuit couple to the core circuit and the communication module for performing the core circuit self-testing.

Abstract: A probing system for integrated circuit device, which transmits testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system includes test head having a first transceiving module. There is a test station having a test unit coupled to the test head to perform test operation. A communication module has a second transceiving module configured to exchange data with the first transceiving module in a wireless manner. There is an integrated circuit device having a core circuit being tested, and a test module having a self-test circuit coupled to the core circuit and the communication module for performing the core circuit self-testing.

Abstract: The present invention discloses a probing system for integrated circuit devices, which transmits testing data between an automatic test equipment (ATE) and an integrated circuit device. The ATE includes a first transceiving module, and the integrated circuit device includes a core circuit, a built-in self-test (BIST) circuit electrically connected to the core circuit, a controller configured to control the operation of the BIST circuit, and a second transceiving module configured to exchange testing data with the first transceiving module. Preferably, the integrated circuit device further includes a clock generator and a power regulator electrically connected to the second transceiving module, wherein the ATE transmits a radio frequency signal via the first transceiving module, and the second transceiving module receives the radio frequency signal to drive the power regulator to generate power for the integrated circuit device to initiate the BIST circuit.

Abstract: The present invention discloses a probing system for integrated circuit devices, which transmits testing data between an automatic test equipment (ATE) and an integrated circuit device. The ATE includes a first transceiving module, and the integrated circuit device includes a core circuit, a built-in self-test (BIST) circuit electrically connected to the core circuit, a controller configured to control the operation of the BIST circuit, and a second transceiving module configured to exchange testing data with the first transceiving module. Preferably, the integrated circuit device further includes a clock generator and a power regulator electrically connected to the second transceiving module, wherein the ATE transmits a radio frequency signal via the first transceiving module, and the second transceiving module receives the radio frequency signal to drive the power regulator to generate power for the integrated circuit device to initiate the BIST circuit.

Abstract: In a method of testing a multi-port memory in accordance with a test pattern, test clock signals having the same test clock frequency but with different delay periods introduced therein are generated for controlling memory access through the different access ports of the memory. Consecutive memory operations of a test element of the test pattern are then conducted in a folded sequence upon a memory cell through the different access ports in accordance with the test clock signals such that the memory operations are completed within the same test clock cycle of the test element.

Abstract: The present invention discloses a diagonal testing method for flash memories. The testing method regards the flash memory as several squares, and executes in the direction from top to bottom and from left to right. Each square is provided with a first diagonal in ?45 degrees from the upper left to the lower right, and a second diagonal in +45 degrees from the lower left to the upper right. The present invention is to program the cells in the first diagonal or the second diagonal, and then read the cells except the first diagonal or the second diagonal; or, program the cells except the first diagonal or the second diagonal, and then read the cells in the first diagonal or the second diagonal so as to detect the disturb fault in the flash memories and normal memory fault models.

Abstract: A test pattern generation and comparison circuit creates test pattern stimulus signals for and evaluates response signals from logic or memory such as random access memory (RAM). It utilizes both parallel and serial interfaces to the logic/memory under test. The test pattern generation and comparison circuit further provides a method for testing logic and memory utilizing built-in self test (BIST) techniques. The method uses a programmable logic/memory commands which are translated into physical logic signals and timings for the logic or memory under test. The results of the test pattern generated and applied to the logic or memory are compared to expected results. The result of the comparison is a pass/fail designation. In addition, the comparison of the expected test results with the actual test results provides information on the exact location of the failure.